{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,25]],"date-time":"2026-07-25T03:11:58Z","timestamp":1784949118537,"version":"3.55.0"},"reference-count":87,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2024,3,1]],"date-time":"2024-03-01T00:00:00Z","timestamp":1709251200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,3,1]],"date-time":"2024-03-01T00:00:00Z","timestamp":1709251200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,3,1]],"date-time":"2024-03-01T00:00:00Z","timestamp":1709251200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"National Key Research and Development Program of China","award":["2021YFB1715600"],"award-info":[{"award-number":["2021YFB1715600"]}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61932012"],"award-info":[{"award-number":["61932012"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62141215"],"award-info":[{"award-number":["62141215"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62372228"],"award-info":[{"award-number":["62372228"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004543","name":"China Scholarship Council","doi-asserted-by":"publisher","award":["202306190117"],"award-info":[{"award-number":["202306190117"]}],"id":[{"id":"10.13039\/501100004543","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IIEEE Trans. Software Eng."],"published-print":{"date-parts":[[2024,3]]},"DOI":"10.1109\/tse.2024.3354969","type":"journal-article","created":{"date-parts":[[2024,1,17]],"date-time":"2024-01-17T18:25:38Z","timestamp":1705515938000},"page":"474-494","source":"Crossref","is-referenced-by-count":23,"title":["APPT: Boosting Automated Patch Correctness Prediction via Fine-Tuning Pre-Trained Models"],"prefix":"10.1109","volume":"50","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-2495-3805","authenticated-orcid":false,"given":"Quanjun","family":"Zhang","sequence":"first","affiliation":[{"name":"State Key Laboratory for Novel Software Technology, Nanjing University, Nanjing, Jiangsu, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9930-7111","authenticated-orcid":false,"given":"Chunrong","family":"Fang","sequence":"additional","affiliation":[{"name":"State Key Laboratory for Novel Software Technology, Nanjing University, Nanjing, Jiangsu, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9236-8264","authenticated-orcid":false,"given":"Weisong","family":"Sun","sequence":"additional","affiliation":[{"name":"State Key Laboratory for Novel Software Technology, Nanjing University, Nanjing, Jiangsu, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0006-2647-2059","authenticated-orcid":false,"given":"Yan","family":"Liu","sequence":"additional","affiliation":[{"name":"State Key Laboratory for Novel Software Technology, Nanjing University, Nanjing, Jiangsu, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9649-1796","authenticated-orcid":false,"given":"Tieke","family":"He","sequence":"additional","affiliation":[{"name":"State Key Laboratory for Novel Software Technology, Nanjing University, Nanjing, Jiangsu, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-9721-6219","authenticated-orcid":false,"given":"Xiaodong","family":"Hao","sequence":"additional","affiliation":[{"name":"State Key Laboratory for Novel Software Technology, Nanjing University, Nanjing, Jiangsu, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9592-7022","authenticated-orcid":false,"given":"Zhenyu","family":"Chen","sequence":"additional","affiliation":[{"name":"State Key Laboratory for Novel Software Technology, Nanjing University, Nanjing, Jiangsu, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2017.2755013"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2021.3125203"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2009.5070530"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tse.2022.3152089"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/3318162"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MS.2021.3071086"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/3540250.3558953"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/3338906.3338911"},{"key":"ref9","doi-asserted-by":"crossref","first-page":"615","DOI":"10.1145\/3377811.3380338","article-title":"On the efficiency of test suite based program repair: A systematic assessment of 16 automated repair systems for Java programs","volume-title":"Proc. 42nd ACM\/IEEE Int. Conf. Softw. Eng. (ICSE)","author":"Liu","year":"2020"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2019.00064"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/2884781.2884872"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/2635868.2635873"},{"key":"ref13","article-title":"Program repair: Automated vs. manual","author":"Zhang","year":"2022"},{"key":"ref14","first-page":"981","article-title":"Evaluating representation learning of code changes for predicting patch correctness in program repair","volume-title":"Proc. 35th IEEE\/ACM Int. Conf. Automated Softw. Eng. (ASE)","author":"Tian","year":"2020"},{"key":"ref15","first-page":"968","article-title":"Automated patch correctness assessment: How far are we?","volume-title":"Proc. 35th IEEE\/ACM Int. Conf. Automated Softw. Eng. (ASE)","author":"Wang","year":"2020"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1145\/2950290.2950295"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1145\/2025113.2025179"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1145\/1297846.1297902"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1145\/3180155.3180182"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2021.3071750"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1145\/3511096"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1145\/3576039"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2016.2521368"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1145\/3395363.3397351"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1145\/2786805.2786825"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1145\/3505247"},{"key":"ref27","article-title":"BERT: Pre-training of deep bidirectional transformers for language understanding","author":"Devlin","year":"2018"},{"key":"ref28","first-page":"1877","article-title":"Language models are few-shot learners","volume-title":"Proc. Adv. Neural Inf. Process. Syst. (NeurIPS)","volume":"33","author":"Brown","year":"2020"},{"issue":"1","key":"ref29","first-page":"1","article-title":"Exploring the limits of transfer learning with a unified text-to-text transformer","volume":"21","author":"Raffel","year":"2020","journal-title":"J. Mach. Learn. Res."},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.18653\/v1\/2022.acl-long.499"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.18653\/v1\/2020.findings-emnlp.139"},{"key":"ref32","first-page":"1","article-title":"GraphCodeBERT: Pre-training code representations with data flow","volume-title":"Proc. 9th Int. Conf. Learn. Representations (ICLR)","author":"Guo","year":"2021"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE43902.2021.00107"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.14722\/ndss.2018.23158"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1145\/3510003.3510147"},{"key":"ref36","doi-asserted-by":"crossref","first-page":"602","DOI":"10.1145\/3377811.3380345","article-title":"DLFix: Context-based code transformation learning for automated program repair","volume-title":"Proc. 42nd ACM\/IEEE Int. Conf. Softw. Eng. (ICSE)","author":"Li","year":"2020"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1145\/3290353"},{"key":"ref38","first-page":"1","article-title":"Adam: A method for stochastic optimization","volume-title":"Proc. 3rd Int. Conf. Learn. Representations (ICLR Poster)","author":"Kingma","year":"2015"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1145\/2610384.2628055"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/ASE.2017.8115674"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1145\/3180155.3180245"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1145\/3180155.3180233"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/SANER.2018.8330202"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2019.2940179"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1145\/3379597.3387491"},{"key":"ref46","doi-asserted-by":"crossref","first-page":"10","DOI":"10.1145\/3196398.3196473","article-title":"Bugs.jar: A large-scale, diverse dataset of real-world Java bugs","volume-title":"Proc. 15th Int. Conf. Mining Softw. Repositories (MSR)","author":"Saha","year":"2018"},{"key":"ref47","article-title":"IntroClassJava: A benchmark of 297 small and buggy Java programs","author":"Durieux","year":"2016"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/SANER.2019.8667991"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1145\/3135932.3135941"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1145\/3092703.3092718"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1109\/IBF50092.2020.9034821"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1109\/ASE.2017.8115676"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1145\/3106237.3106309"},{"key":"ref54","article-title":"PatchZero: Zero-shot automatic patch correctness assessment","author":"Zhou","year":"2023"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2023.3255177"},{"key":"ref56","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-020-09920-w"},{"key":"ref57","doi-asserted-by":"publisher","DOI":"10.1145\/3106237.3106274"},{"key":"ref58","first-page":"427","article-title":"CIRCLE: Continual repair across programming languages","volume-title":"Proc. 31th ACM SIGSOFT Int. Symp. Softw. Testing Anal. (ISSTA)","author":"Wei","year":"2022"},{"key":"ref59","doi-asserted-by":"publisher","DOI":"10.1145\/3510003.3510222"},{"key":"ref60","doi-asserted-by":"crossref","first-page":"518","DOI":"10.1145\/3377811.3380361","article-title":"CC2Vec: Distributed representations of code changes","volume-title":"Proc. 42nd ACM\/IEEE Int. Conf. Softw. Eng. (ICSE)","author":"Hoang","year":"2020"},{"key":"ref61","doi-asserted-by":"publisher","DOI":"10.1145\/3551349.3556914"},{"key":"ref62","article-title":"The living review on automated program repair","author":"Monperrus","year":"2023"},{"key":"ref63","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2011.104"},{"key":"ref64","doi-asserted-by":"publisher","DOI":"10.1145\/2931037.2948705"},{"key":"ref65","doi-asserted-by":"publisher","DOI":"10.1145\/2896921.2896931"},{"key":"ref66","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2016.2560811"},{"key":"ref67","doi-asserted-by":"publisher","DOI":"10.1145\/2884781.2884807"},{"key":"ref68","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-019-09780-z"},{"key":"ref69","doi-asserted-by":"publisher","DOI":"10.1109\/SANER.2019.8667970"},{"key":"ref70","doi-asserted-by":"publisher","DOI":"10.1145\/3468264.3468544"},{"key":"ref71","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2018.2874648"},{"key":"ref72","doi-asserted-by":"publisher","DOI":"10.1145\/3213846.3213871"},{"key":"ref73","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-99241-9_3"},{"key":"ref74","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-016-9470-4"},{"key":"ref75","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2017.45"},{"key":"ref76","doi-asserted-by":"publisher","DOI":"10.1145\/3293882.3330577"},{"key":"ref77","doi-asserted-by":"publisher","DOI":"10.1145\/3293882.3330559"},{"key":"ref78","doi-asserted-by":"publisher","DOI":"10.1109\/SANER.2019.8668043"},{"key":"ref79","doi-asserted-by":"publisher","DOI":"10.1145\/3340544"},{"key":"ref80","doi-asserted-by":"publisher","DOI":"10.1609\/aaai.v31i1.10742"},{"key":"ref81","doi-asserted-by":"publisher","DOI":"10.1145\/3395363.3397369"},{"key":"ref82","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2022.3194188"},{"key":"ref83","doi-asserted-by":"publisher","DOI":"10.1109\/MSR52588.2021.00024"},{"key":"ref84","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE43902.2021.00041"},{"key":"ref85","doi-asserted-by":"publisher","DOI":"10.1145\/3510003.3510042"},{"key":"ref86","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2022.3192755"},{"key":"ref87","doi-asserted-by":"publisher","DOI":"10.1109\/MSR52588.2021.00063"}],"container-title":["IEEE Transactions on Software Engineering"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/32\/10473597\/10402095.pdf?arnumber=10402095","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T18:16:13Z","timestamp":1725560173000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10402095\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,3]]},"references-count":87,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tse.2024.3354969","relation":{},"ISSN":["0098-5589","1939-3520","2326-3881"],"issn-type":[{"value":"0098-5589","type":"print"},{"value":"1939-3520","type":"electronic"},{"value":"2326-3881","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,3]]}}}