{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,22]],"date-time":"2026-04-22T19:26:39Z","timestamp":1776885999985,"version":"3.51.2"},"reference-count":16,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2025,3,1]],"date-time":"2025-03-01T00:00:00Z","timestamp":1740787200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,3,1]],"date-time":"2025-03-01T00:00:00Z","timestamp":1740787200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-009"},{"start":{"date-parts":[[2025,3,1]],"date-time":"2025-03-01T00:00:00Z","timestamp":1740787200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-001"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IIEEE Trans. Software Eng."],"published-print":{"date-parts":[[2025,3]]},"DOI":"10.1109\/tse.2025.3537080","type":"journal-article","created":{"date-parts":[[2025,1,31]],"date-time":"2025-01-31T18:31:58Z","timestamp":1738348318000},"page":"728-731","source":"Crossref","is-referenced-by-count":1,"title":["A Reflection on \u201cAdvances in Software Inspections\u201d"],"prefix":"10.1109","volume":"51","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-7764-7433","authenticated-orcid":false,"given":"Adam A.","family":"Porter","sequence":"first","affiliation":[{"name":"University of Maryland, College Park, MD, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4482-5712","authenticated-orcid":false,"given":"Harvey","family":"Siy","sequence":"additional","affiliation":[{"name":"University of Nebraska at Omaha, Omaha, NE, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-6825-4748","authenticated-orcid":false,"given":"Lawrence","family":"Votta","sequence":"additional","affiliation":[{"name":"Computer and Applications Consultant, Bellevue, WA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1147\/sj.153.0182"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.1986.6312976"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/s0065-2458(08)60484-2"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.1989.559782"},{"key":"ref5","volume-title":"Software Inspection.","author":"Gilb","year":"1993"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/32.391380"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/256428.167070"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/0164-1212(87)90025-2"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/2.86785"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/163359.163366"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/128894.128897"},{"key":"ref12","first-page":"573","article-title":"Reviews","volume-title":"Code Complete","volume":"24","author":"McConnell","year":"1993"},{"key":"ref13","article-title":"The evolution of code review research: A systematic mapping study","author":"Wang","year":"2019"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-015-9381-9"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/3585004"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2023.3348172"}],"container-title":["IEEE Transactions on Software Engineering"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/32\/10930340\/10859180.pdf?arnumber=10859180","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,28]],"date-time":"2025-03-28T19:57:32Z","timestamp":1743191852000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10859180\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,3]]},"references-count":16,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tse.2025.3537080","relation":{},"ISSN":["0098-5589","1939-3520","2326-3881"],"issn-type":[{"value":"0098-5589","type":"print"},{"value":"1939-3520","type":"electronic"},{"value":"2326-3881","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,3]]}}}