{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,23]],"date-time":"2026-03-23T21:04:17Z","timestamp":1774299857827,"version":"3.50.1"},"reference-count":53,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2026,3,1]],"date-time":"2026-03-01T00:00:00Z","timestamp":1772323200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,3,1]],"date-time":"2026-03-01T00:00:00Z","timestamp":1772323200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,3,1]],"date-time":"2026-03-01T00:00:00Z","timestamp":1772323200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62250610224"],"award-info":[{"award-number":["62250610224"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"CCF-Zhipu Large Model Innovation Fund","award":["CCF-Zhipu202408"],"award-info":[{"award-number":["CCF-Zhipu202408"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IIEEE Trans. Software Eng."],"published-print":{"date-parts":[[2026,3]]},"DOI":"10.1109\/tse.2026.3655712","type":"journal-article","created":{"date-parts":[[2026,1,20]],"date-time":"2026-01-20T20:40:08Z","timestamp":1768941608000},"page":"908-922","source":"Crossref","is-referenced-by-count":0,"title":["Subgraph-Oriented Testing for Deep Learning Libraries"],"prefix":"10.1109","volume":"52","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2828-7165","authenticated-orcid":false,"given":"Xiaoyuan","family":"Xie","sequence":"first","affiliation":[{"name":"School of Computer Science, Wuhan University, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-9478-6978","authenticated-orcid":false,"given":"Yan","family":"Song","sequence":"additional","affiliation":[{"name":"School of Computer Science, Wuhan University, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1220-8728","authenticated-orcid":false,"given":"Songqiang","family":"Chen","sequence":"additional","affiliation":[{"name":"Department of Computer Science and Engineering, The Hong Kong University of Science and Technology, Hong Kong, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7410-9146","authenticated-orcid":false,"given":"Jinfu","family":"Chen","sequence":"additional","affiliation":[{"name":"School of Computer Science, Wuhan University, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/s11704-024-40060-2"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1609\/aimag.v42i3.18140"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/3439726"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2021.3059968"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1155\/2021\/8387680"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/s11704-023-2689-5"},{"key":"ref7","first-page":"8026","article-title":"Pytorch: An imperative style, high-performance deep learning library","volume-title":"Proc. Adv. Neural Inf. Process. Syst.","volume":"32","author":"Paszke","year":"2019"},{"key":"ref8","article-title":"A survey of deep learning library testing methods","author":"Zhang","year":"2024"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ASE.2017.8115662"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2019.00107"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/3628159"},{"key":"ref12","first-page":"486","article-title":"AUDEE: Automated testing for deep learning frameworks","volume-title":"Proc. 35th IEEE\/ACM Int. Conf. Automated Softw. Eng. (ASE)","author":"Guo","year":"2020"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1145\/3368089.3409761"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/3510003.3510041"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/s11704-023-2597-8"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1145\/3533767.3534220"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1145\/3540250.3549085"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1145\/3597926.3598067"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1145\/3597926.3598088"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1145\/3460319.3464843"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/icse48619.2023.00105"},{"key":"ref22","doi-asserted-by":"crossref","first-page":"1261","DOI":"10.1145\/3377811.3380359","article-title":"Efficient generation of error-inducing floating-point inputs via symbolic execution","volume-title":"Proc. ACM\/IEEE 42nd Int. Conf. Softw. Eng.","author":"Guo","year":"2020"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/icse43902.2021.00037"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1145\/3510003.3510092"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1145\/3583566"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1145\/3510003.3510165"},{"key":"ref27","article-title":"Replication package and details of the survey for sort","year":"2024"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1145\/2555243.2555265"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1145\/3551349.3559561"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.243"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-39945-3_5"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.4324\/9781032646527"},{"key":"ref34","article-title":"Overview of Pytorch autograd engine","year":"2025"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/ICDM.2002.1184038"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1017\/S0269888912000331"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1145\/3611643.3616337"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1145\/3587155"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/ICSME58846.2023.00031"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2021.110935"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV48922.2021.00042"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1007\/s11263-015-0816-y"},{"key":"ref43","article-title":"Learning multiple layers of features from tiny images","author":"Krizhevsky","year":"2009"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/ASE.2019.00078"},{"key":"ref45","article-title":"Concrete inputs and outputs for precision bugs","year":"2024"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1145\/2522920.2522924"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2017.56"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1007\/s11219-017-9388-0"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/TPDS.2020.3030548"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1109\/icse55347.2025.00025"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1145\/3735637"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-022-10273-9"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1145\/3510454.3516835"}],"container-title":["IEEE Transactions on Software Engineering"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/32\/11440029\/11359135.pdf?arnumber=11359135","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,3,23]],"date-time":"2026-03-23T20:07:26Z","timestamp":1774296446000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11359135\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,3]]},"references-count":53,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tse.2026.3655712","relation":{},"ISSN":["0098-5589","1939-3520","2326-3881"],"issn-type":[{"value":"0098-5589","type":"print"},{"value":"1939-3520","type":"electronic"},{"value":"2326-3881","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,3]]}}}