{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,24]],"date-time":"2026-06-24T15:20:14Z","timestamp":1782314414072,"version":"3.54.5"},"reference-count":47,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2022,11,1]],"date-time":"2022-11-01T00:00:00Z","timestamp":1667260800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,11,1]],"date-time":"2022-11-01T00:00:00Z","timestamp":1667260800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,11,1]],"date-time":"2022-11-01T00:00:00Z","timestamp":1667260800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Smart Grid"],"published-print":{"date-parts":[[2022,11]]},"DOI":"10.1109\/tsg.2022.3188199","type":"journal-article","created":{"date-parts":[[2022,7,4]],"date-time":"2022-07-04T19:58:09Z","timestamp":1656964689000},"page":"4525-4537","source":"Crossref","is-referenced-by-count":35,"title":["Distributed Finite-Time Fault-Tolerant Control of Isolated AC Microgrids Considering Input Constraints"],"prefix":"10.1109","volume":"13","author":[{"given":"Mahmood","family":"Jamali","sequence":"first","affiliation":[{"name":"Department of Automatic Control and Systems Engineering, University of Sheffield, Sheffield, U.K."}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3127-6398","authenticated-orcid":false,"given":"Hamid Reza","family":"Baghaee","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Amirkabir University of Technology, Tehran, Iran"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4609-9152","authenticated-orcid":false,"given":"Mahdieh S.","family":"Sadabadi","sequence":"additional","affiliation":[{"name":"School of Electronic Engineering and Computer Science, Queen Mary University of London, London, U.K."}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1521-790X","authenticated-orcid":false,"given":"Gevork B.","family":"Gharehpetian","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Amirkabir University of Technology, Tehran, Iran"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5505-3252","authenticated-orcid":false,"given":"Amjad","family":"Anvari-Moghaddam","sequence":"additional","affiliation":[{"name":"Department of Energy, Aalborg University, Aalborg, Denmark"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8311-7412","authenticated-orcid":false,"given":"Frede","family":"Blaabjerg","sequence":"additional","affiliation":[{"name":"Department of Energy, Aalborg University, Aalborg, Denmark"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2019.2916727"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2020.2988509"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2896955"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2014.2337838"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2020.3012026"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2016.2557813"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1049\/iet-rpg.2019.1113"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2016.2569602"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2975494"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1049\/iet-rpg.2019.1180"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2726970"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2017.2743011"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2021.3054780"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1049\/iet-gtd.2012.0576"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2016.2628785"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2016.2638858"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSYST.2021.3056481"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2013.2247071"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2019.2944768"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2020.2975115"},{"key":"ref21","volume-title":"An Introduction From Fault Detection to Fault Tolerance","author":"Isermann","year":"2006"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2011.2124436"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2301712"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2019.02.002"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2010.2054115"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/63.988947"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2021.3064361"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2011.05.013"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2012.2190676"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2015.02.001"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2009.01.021"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cta.2011.0047"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2016.2634085"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2014.6953756"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/HICSS.2015.321"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2018.2810287"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2014.2303233"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TDSC.2004.2"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1016\/j.heliyon.2020.e04799"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1007\/s41403-021-00284-1"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2021.3070820"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2531379"},{"key":"ref43","volume-title":"Nonlinear Systems","volume":"3","author":"Khalil","year":"2002"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2869280"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2014.2362763"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/MCS.2014.2350571"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cta.2013.0334"}],"container-title":["IEEE Transactions on Smart Grid"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/5165411\/9927219\/09814863.pdf?arnumber=9814863","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T04:07:59Z","timestamp":1706760479000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9814863\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,11]]},"references-count":47,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tsg.2022.3188199","relation":{},"ISSN":["1949-3053","1949-3061"],"issn-type":[{"value":"1949-3053","type":"print"},{"value":"1949-3061","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,11]]}}}