{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,25]],"date-time":"2026-07-25T16:24:11Z","timestamp":1784996651719,"version":"3.55.0"},"reference-count":45,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"7","license":[{"start":{"date-parts":[[2022,7,1]],"date-time":"2022-07-01T00:00:00Z","timestamp":1656633600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,7,1]],"date-time":"2022-07-01T00:00:00Z","timestamp":1656633600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,7,1]],"date-time":"2022-07-01T00:00:00Z","timestamp":1656633600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["U1804147"],"award-info":[{"award-number":["U1804147"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61573129"],"award-info":[{"award-number":["61573129"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61833001"],"award-info":[{"award-number":["61833001"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003488","name":"Innovative Scientists and Technicians Team of Henan Polytechnic University","doi-asserted-by":"publisher","award":["T2019-2"],"award-info":[{"award-number":["T2019-2"]}],"id":[{"id":"10.13039\/501100003488","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Innovative Scientists and Technicians Team of Henan Provincial High Education","award":["20IRTSTHN019"],"award-info":[{"award-number":["20IRTSTHN019"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Syst. Man Cybern, Syst."],"published-print":{"date-parts":[[2022,7]]},"DOI":"10.1109\/tsmc.2021.3091422","type":"journal-article","created":{"date-parts":[[2021,7,1]],"date-time":"2021-07-01T19:44:03Z","timestamp":1625168643000},"page":"4117-4128","source":"Crossref","is-referenced-by-count":104,"title":["Resilient Model-Free Adaptive Iterative Learning Control for Nonlinear Systems Under Periodic DoS Attacks via a Fading Channel"],"prefix":"10.1109","volume":"52","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-6694-9655","authenticated-orcid":false,"given":"Wei","family":"Yu","sequence":"first","affiliation":[{"name":"School of Electrical Engineering and Automation, Henan Polytechnic University, Jiaozuo, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Rui","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and Automation, Henan Polytechnic University, Jiaozuo, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5752-1091","authenticated-orcid":false,"given":"Xuhui","family":"Bu","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and Automation, Henan Polytechnic University, Jiaozuo, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5278-3420","authenticated-orcid":false,"given":"Zhongsheng","family":"Hou","sequence":"additional","affiliation":[{"name":"School of Automation, Qingdao University, Qingdao, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Zhonghua","family":"Wu","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering and Automation, Henan Polytechnic University, Jiaozuo, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1002\/rob.4620010203"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MCS.2006.1636313"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2016.05.031"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2017.2677959"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2019.2931877"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2012.08.026"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2253071"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TITS.2016.2615302"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2011.2161428"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/s11432-019-2714-7"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2021.109595"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2017.2787740"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1002\/rnc.3300"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2016.2532351"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2020.3011329"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2020.3004187"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2017.2690689"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2018.2817610"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2016.2541919"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2013.2279896"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2019.108687"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2017.10.009"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2018.2868781"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2014.2303233"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.sysconle.2016.07.007"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TMC.2010.75"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2018.2806387"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2018.04.082"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2015.2409905"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2015.2462741"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2015.2416924"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2017.01.031"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2020.2970415"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2010.2093136"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2019.2894586"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2947873"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2017.2672664"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TNN.2011.2176141"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1360\/aas-007-1061"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2019.2919441"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2018.2814628"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2017.2734799"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1016\/j.sysconle.2004.08.009"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2009.06.025"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2015.2454484"}],"container-title":["IEEE Transactions on Systems, Man, and Cybernetics: Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6221021\/9797002\/09470782.pdf?arnumber=9470782","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,11]],"date-time":"2024-01-11T23:32:58Z","timestamp":1705015978000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9470782\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,7]]},"references-count":45,"journal-issue":{"issue":"7"},"URL":"https:\/\/doi.org\/10.1109\/tsmc.2021.3091422","relation":{},"ISSN":["2168-2216","2168-2232"],"issn-type":[{"value":"2168-2216","type":"print"},{"value":"2168-2232","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,7]]}}}