{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,3]],"date-time":"2026-06-03T15:34:16Z","timestamp":1780500856317,"version":"3.54.1"},"reference-count":33,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"11","license":[{"start":{"date-parts":[[2022,11,1]],"date-time":"2022-11-01T00:00:00Z","timestamp":1667260800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,11,1]],"date-time":"2022-11-01T00:00:00Z","timestamp":1667260800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,11,1]],"date-time":"2022-11-01T00:00:00Z","timestamp":1667260800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62073143"],"award-info":[{"award-number":["62073143"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61922063"],"award-info":[{"award-number":["61922063"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012247","name":"Program of Shanghai Academic Research Leader","doi-asserted-by":"publisher","award":["19XD1421000"],"award-info":[{"award-number":["19XD1421000"]}],"id":[{"id":"10.13039\/501100012247","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Shanghai and HongKong\u2013Macao\u2013Taiwan Science and Technology Cooperation Project","award":["19510760200"],"award-info":[{"award-number":["19510760200"]}]},{"name":"Shanghai Shuguang Project","award":["18SG18"],"award-info":[{"award-number":["18SG18"]}]},{"DOI":"10.13039\/501100003395","name":"Innovation Program of Shanghai Municipal Education Commission","doi-asserted-by":"publisher","award":["2021-01-07-00-02-E00107"],"award-info":[{"award-number":["2021-01-07-00-02-E00107"]}],"id":[{"id":"10.13039\/501100003395","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Syst. Man Cybern, Syst."],"published-print":{"date-parts":[[2022,11]]},"DOI":"10.1109\/tsmc.2022.3156848","type":"journal-article","created":{"date-parts":[[2022,4,19]],"date-time":"2022-04-19T19:32:21Z","timestamp":1650396741000},"page":"7053-7064","source":"Crossref","is-referenced-by-count":27,"title":["Distributed Dimensionality Reduction Fusion Estimation for Stochastic Uncertain Systems With Fading Measurements Subject to Mixed Attacks"],"prefix":"10.1109","volume":"52","author":[{"given":"Sha","family":"Fan","sequence":"first","affiliation":[{"name":"Key Laboratory of Smart Manufacturing in Energy Chemical Process of Ministry of Education, East China University of Science and Technology, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5496-1809","authenticated-orcid":false,"given":"Huaicheng","family":"Yan","sequence":"additional","affiliation":[{"name":"Key Laboratory of Smart Manufacturing in Energy Chemical Process of Ministry of Education, East China University of Science and Technology, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4527-9610","authenticated-orcid":false,"given":"Hao","family":"Zhang","sequence":"additional","affiliation":[{"name":"Department of Control Science and Engineering, Tongji University, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9737-6765","authenticated-orcid":false,"given":"Yueying","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Mechatronics Engineering and Automation, Shanghai University, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1312-9527","authenticated-orcid":false,"given":"Yan","family":"Peng","sequence":"additional","affiliation":[{"name":"School of Mechatronics Engineering and Automation, Shanghai University, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8016-9310","authenticated-orcid":false,"given":"Shaorong","family":"Xie","sequence":"additional","affiliation":[{"name":"School of Mechatronics Engineering and Automation, Shanghai University, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2017.2723760"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.inffus.2020.01.009"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2020.3036626"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2018.2884952"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2019.2948380"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2021.109843"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2021.3078299"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2018.2856819"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.inffus.2018.01.008"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2004.01.014"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2013.2297192"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2016.12.026"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2018.2830304"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2014.2357113"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2014.2323021"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2017.2716970"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TFUZZ.2016.2578346"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2018.2874804"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2015.2450271"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2017.2696746"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2022.3143903"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2018.2888633"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2015.2461851"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.jfranklin.2018.06.016"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2017.2716115"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2015.2409905"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2018.2865238"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2017.2697450"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2011.11.038"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2017.2770102"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2015.2498701"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2016.2539221"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.1982.4308806"}],"container-title":["IEEE Transactions on Systems, Man, and Cybernetics: Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6221021\/9919317\/09760103.pdf?arnumber=9760103","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,22]],"date-time":"2024-01-22T21:11:48Z","timestamp":1705957908000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9760103\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,11]]},"references-count":33,"journal-issue":{"issue":"11"},"URL":"https:\/\/doi.org\/10.1109\/tsmc.2022.3156848","relation":{},"ISSN":["2168-2216","2168-2232"],"issn-type":[{"value":"2168-2216","type":"print"},{"value":"2168-2232","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,11]]}}}