{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,20]],"date-time":"2026-06-20T16:29:20Z","timestamp":1781972960485,"version":"3.54.5"},"reference-count":41,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2024,4,1]],"date-time":"2024-04-01T00:00:00Z","timestamp":1711929600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,4,1]],"date-time":"2024-04-01T00:00:00Z","timestamp":1711929600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,4,1]],"date-time":"2024-04-01T00:00:00Z","timestamp":1711929600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["U20A6004"],"award-info":[{"award-number":["U20A6004"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","award":["HUST:2021GCRC058"],"award-info":[{"award-number":["HUST:2021GCRC058"]}],"id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004543","name":"China Scholarship Council","doi-asserted-by":"publisher","award":["202306160078"],"award-info":[{"award-number":["202306160078"]}],"id":[{"id":"10.13039\/501100004543","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Syst. Man Cybern, Syst."],"published-print":{"date-parts":[[2024,4]]},"DOI":"10.1109\/tsmc.2023.3344383","type":"journal-article","created":{"date-parts":[[2024,1,17]],"date-time":"2024-01-17T18:28:39Z","timestamp":1705516119000},"page":"2342-2353","source":"Crossref","is-referenced-by-count":28,"title":["BiaS: Incorporating Biased Knowledge to Boost Unsupervised Image Anomaly Localization"],"prefix":"10.1109","volume":"54","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-7619-6618","authenticated-orcid":false,"given":"Yunkang","family":"Cao","sequence":"first","affiliation":[{"name":"State Key Laboratory of Digital Manufacturing Equipment and Technology, Huazhong University of Science and Technology, Wuhan, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2162-0116","authenticated-orcid":false,"given":"Xiaohao","family":"Xu","sequence":"additional","affiliation":[{"name":"Michigan Robotics, University of Michigan, Ann Arbor, MI, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-5776-7825","authenticated-orcid":false,"given":"Chen","family":"Sun","sequence":"additional","affiliation":[{"name":"Department of Mechanical & Industrial Engineering, University of Toronto, Toronto, Canada"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1485-0722","authenticated-orcid":false,"given":"Liang","family":"Gao","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Digital Manufacturing Equipment and Technology, Huazhong University of Science and Technology, Wuhan, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5204-7992","authenticated-orcid":false,"given":"Weiming","family":"Shen","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Digital Manufacturing Equipment and Technology, Huazhong University of Science and Technology, Wuhan, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/s11263-020-01400-4"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2022.3166397"},{"key":"ref3","article-title":"IM-IAD: Industrial image anomaly detection benchmark in manufacturing","author":"Xie","year":"2023","journal-title":"arXiv:2301.13359"},{"key":"ref4","article-title":"Real3D-AD: A dataset of point cloud anomaly detection","author":"Liu","year":"2023","journal-title":"arXiv:2309.13226"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2022.3229096"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2021.103459"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52688.2022.00724"},{"key":"ref8","article-title":"Explainable deep few-shot anomaly detection with deviation networks","author":"Pang","year":"2021","journal-title":"arXiv:2108.00462"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2958826"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2018.2871750"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/WACV.2018.00150"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-019-01476-x"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2022.108846"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2020.11.018"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52688.2022.00951"},{"key":"ref16","first-page":"1","article-title":"Student-teacher feature pyramid matching for anomaly detection","volume-title":"Proc. Brit. Mach. Vis. Conf.","author":"Wang"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2021.3127716"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2023.3241579"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2018.2827937"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/tcyb.2022.3227044"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2022.3159538"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2017.2668395"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1007\/s11263-015-0816-y"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3094452"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-68799-1_35"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/WACV51458.2022.00188"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52688.2022.01392"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3142326"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2023.3293772"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR46437.2021.01466"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52729.2023.00381"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52729.2023.02348"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3182385"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/CASE49997.2022.9926547"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR46437.2021.00954"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/ISIE45552.2021.9576231"},{"key":"ref37","first-page":"1","article-title":"Decoupled weight decay regularization","volume-title":"Proc. 7th Int. Conf. Learn. Represent., (ICLR)","author":"Loshchilov"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2014.461"},{"key":"ref39","article-title":"Segment any anomaly without training via hybrid prompt regularization","author":"Cao","year":"2023","journal-title":"arXiv:2305.10724"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52688.2022.01042"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV51070.2023.00355"}],"container-title":["IEEE Transactions on Systems, Man, and Cybernetics: Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6221021\/10474538\/10402554.pdf?arnumber=10402554","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,21]],"date-time":"2024-11-21T19:15:10Z","timestamp":1732216510000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10402554\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,4]]},"references-count":41,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tsmc.2023.3344383","relation":{},"ISSN":["2168-2216","2168-2232"],"issn-type":[{"value":"2168-2216","type":"print"},{"value":"2168-2232","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,4]]}}}