{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,26]],"date-time":"2026-04-26T13:38:12Z","timestamp":1777210692462,"version":"3.51.4"},"reference-count":52,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61933015"],"award-info":[{"award-number":["61933015"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61703371"],"award-info":[{"award-number":["61703371"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62273030"],"award-info":[{"award-number":["62273030"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"Central University Basic Research Fund of China","doi-asserted-by":"publisher","award":["K20200002"],"award-info":[{"award-number":["K20200002"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Syst. Man Cybern, Syst."],"published-print":{"date-parts":[[2025,1]]},"DOI":"10.1109\/tsmc.2024.3487776","type":"journal-article","created":{"date-parts":[[2024,11,11]],"date-time":"2024-11-11T13:43:16Z","timestamp":1731332596000},"page":"645-660","source":"Crossref","is-referenced-by-count":17,"title":["TKS-BLS: Temporal Kernel Stationary Broad Learning System for Enhanced Modeling, Anomaly Detection, and Incremental Learning With Application to Ironmaking Processes"],"prefix":"10.1109","volume":"55","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-6611-4754","authenticated-orcid":false,"given":"Siwei","family":"Lou","sequence":"first","affiliation":[{"name":"State Key Laboratory of Industrial Control Technology, Zhejiang University, Hangzhou, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4362-2104","authenticated-orcid":false,"given":"Chunjie","family":"Yang","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Industrial Control Technology, Zhejiang University, Hangzhou, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0810-5811","authenticated-orcid":false,"given":"Liyuan","family":"Kong","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Industrial Control Technology, Zhejiang University, Hangzhou, China"}]},{"given":"Tao","family":"Lin","sequence":"additional","affiliation":[{"name":"Jiangsu Binxin Steel Group Company Ltd., Lianyungang, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6712-1972","authenticated-orcid":false,"given":"Hanwen","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Automation and Electrical Engineering, University of Science and Technology Beijing, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2729-9669","authenticated-orcid":false,"given":"Ping","family":"Wu","sequence":"additional","affiliation":[{"name":"School of Information Science and Engineering, Zhejiang Sci-Tech University, Hangzhou, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4331-0565","authenticated-orcid":false,"given":"Li","family":"Chai","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Industrial Control Technology, Zhejiang University, Hangzhou, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2020.3006124"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3038285"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2021.3113357"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/s11432-020-3132-4"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TKDE.2021.3061215"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2023.3287578"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2022.3164476"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2021.107904"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2022.3213628"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2017.2716952"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2021.3061094"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TKDE.2023.3283425"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2021.115851"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TFUZZ.2021.3128210"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2019.105295"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2022.104886"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2020.2969705"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3170967"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2023.120958"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ICCSSE59359.2023.10244956"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.2307\/1912559"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2018.09.028"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TKDE.2021.3137792"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.3390\/electronics12143118"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1021\/ie801611s"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2003.09.004"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1111\/jtsa.12274"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2021.3140065"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2967708"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2021.3103005"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2024.103262"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2023.3259016"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2020.2995205"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/0005-1098(90)90044-I"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1016\/S0959-1524(99)00033-5"},{"key":"ref36","volume-title":"Time Series Analysis: Forecasting and Control","author":"Box","year":"2015"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/ICMLA.2019.00098"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2021.3053308"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2017.2770092"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TKDE.2021.3061428"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3198170"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3200113"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3157727"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/TKDE.2024.3397878"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2023.111405"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1016\/j.arcontrol.2020.09.004"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1016\/0003-2670(86)80028-9"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2009.10.030"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1016\/j.conengprac.2020.104354"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1016\/j.conengprac.2021.104955"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2016.2635111"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2021.3094512"}],"container-title":["IEEE Transactions on Systems, Man, and Cybernetics: Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6221021\/10805216\/10749989.pdf?arnumber=10749989","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,11,13]],"date-time":"2025-11-13T18:44:32Z","timestamp":1763059472000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10749989\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,1]]},"references-count":52,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tsmc.2024.3487776","relation":{},"ISSN":["2168-2216","2168-2232"],"issn-type":[{"value":"2168-2216","type":"print"},{"value":"2168-2232","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,1]]}}}