{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,4,1]],"date-time":"2025-04-01T12:43:09Z","timestamp":1743511389794},"reference-count":29,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2010,9,1]],"date-time":"2010-09-01T00:00:00Z","timestamp":1283299200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Syst., Man, Cybern. A"],"published-print":{"date-parts":[[2010,9]]},"DOI":"10.1109\/tsmca.2010.2052040","type":"journal-article","created":{"date-parts":[[2010,7,29]],"date-time":"2010-07-29T00:34:04Z","timestamp":1280363644000},"page":"932-944","source":"Crossref","is-referenced-by-count":3,"title":["Pervasive Diagnosis"],"prefix":"10.1109","volume":"40","author":[{"given":"Lukas","family":"Kuhn","sequence":"first","affiliation":[]},{"given":"Bob","family":"Price","sequence":"additional","affiliation":[]},{"given":"Minh","family":"Do","sequence":"additional","affiliation":[]},{"given":"Juan","family":"Liu","sequence":"additional","affiliation":[]},{"given":"Rong","family":"Zhou","sequence":"additional","affiliation":[]},{"given":"Tim","family":"Schmidt","sequence":"additional","affiliation":[]},{"given":"Johan","family":"de Kleer","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1155\/S111086570321204X"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/CDC.2006.377006"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TSMCA.2009.2025572"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TSMCA.2008.2007986"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/PRDC.2006.18"},{"key":"ref15","first-page":"1312","article-title":"continuously estimating persistent and intermittent failure probabilities","author":"de kleer","year":"2009","journal-title":"Proc 7th IFAC Symp Fault Detection Supervision Safety Tech Processes"},{"key":"ref16","first-page":"30","article-title":"on-line planning and scheduling for high-speed manufacturing","author":"ruml","year":"2005","journal-title":"Proc ICAPS"},{"key":"ref17","first-page":"29","author":"reiter","year":"1992","journal-title":"Readings in Model-Based Diagnosis"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/37.476385"},{"key":"ref19","article-title":"Bayesian belief network modeling and diagnosis of xerographic systems","author":"zhong","year":"2000","journal-title":"Proc ASME Symp Controls ImagingIMECE"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/37.722255"},{"key":"ref4","first-page":"370","article-title":"lessons learned in applying domain-independent planning to high-speed manufacturing","author":"do","year":"2006","journal-title":"Proc ICAPS"},{"key":"ref27","first-page":"1762","article-title":"model-based diagnosis and control reconfiguration for discrete event systems: an integrated approach","author":"provan","year":"1999","journal-title":"Proc 38th Conf Decision Control"},{"key":"ref3","first-page":"326","article-title":"temporal planning with mutual exclusion reasoning","author":"smith","year":"1999","journal-title":"Proc IJCAI"},{"key":"ref6","first-page":"239","article-title":"diagnosability of dynamical systems","author":"misra","year":"1992","journal-title":"Proc 3rd Int Workshop Principles Diagnosis (DX)"},{"key":"ref29","first-page":"121","article-title":"heuristic planning with time and resources","author":"haslum","year":"2001","journal-title":"Proc ECP"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TSMCA.2008.2006374"},{"key":"ref8","article-title":"fault isolability prediction of diagnostic models","author":"krysander","year":"2005","journal-title":"Proc 16th Int Workshop Principles Diagnosis"},{"key":"ref7","first-page":"363","article-title":"formal verification of diagnosability via symbolic model checking","author":"cimatti","year":"2003","journal-title":"Proc 18th IJCAI"},{"key":"ref2","first-page":"13","article-title":"managing dynamic temporal constraint networks","author":"cervoni","year":"1994","journal-title":"Proc AIPS"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1002\/0471200611"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/0004-3702(91)90006-6"},{"key":"ref20","first-page":"1129","article-title":"representing diagnostic knowledge for probabilistic horn abduction","author":"poole","year":"1991","journal-title":"Proc IJCAI"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/0004-3702(87)90063-4"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/S0004-3702(98)00068-X"},{"key":"ref24","first-page":"52","article-title":"Troubleshooting temporal behavior in ‘combinational’ circuits","author":"de kleer","year":"2007","journal-title":"Proc 18th Int Workshop Principles Diagnosis"},{"key":"ref23","author":"bushnell","year":"2000","journal-title":"Essentials of Electronic Testing for Digital Memory and Mixed-Signal VLSI Circuits"},{"key":"ref26","year":"2007","journal-title":"Planning and scheduling reconfigurable systems with regular and diagnostic jobs"},{"key":"ref25","first-page":"204","article-title":"debugging sequential circuits using boolean satisfiability","author":"ali","year":"2004","journal-title":"Proc IEEE\/ACM Int Conf Comput -Aided Design"}],"container-title":["IEEE Transactions on Systems, Man, and Cybernetics - Part A: Systems and Humans"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/3468\/5550326\/05524017.pdf?arnumber=5524017","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,11]],"date-time":"2021-10-11T00:45:41Z","timestamp":1633913141000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5524017\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,9]]},"references-count":29,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/tsmca.2010.2052040","relation":{},"ISSN":["1083-4427","1558-2426"],"issn-type":[{"value":"1083-4427","type":"print"},{"value":"1558-2426","type":"electronic"}],"subject":[],"published":{"date-parts":[[2010,9]]}}}