{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,19]],"date-time":"2026-01-19T15:56:56Z","timestamp":1768838216945,"version":"3.49.0"},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2012,11,1]],"date-time":"2012-11-01T00:00:00Z","timestamp":1351728000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Syst., Man, Cybern. C"],"published-print":{"date-parts":[[2012,11]]},"DOI":"10.1109\/tsmcc.2012.2227143","type":"journal-article","created":{"date-parts":[[2012,12,21]],"date-time":"2012-12-21T19:04:54Z","timestamp":1356116694000},"page":"1818-1827","source":"Crossref","is-referenced-by-count":20,"title":["Decision Forest for Root Cause Analysis of Intermittent Faults"],"prefix":"10.1109","volume":"42","author":[{"given":"Satnam","family":"Singh","sequence":"first","affiliation":[]},{"given":"Halasya Siva","family":"Subramania","sequence":"additional","affiliation":[]},{"given":"Steven W.","family":"Holland","sequence":"additional","affiliation":[]},{"given":"Jason T.","family":"Davis","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TSMCA.2005.843392"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/34.709601"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/AERO.2011.5747580"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/PGEC.1967.264748"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TSMCA.2008.2007986"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/COASE.2009.5234134"},{"key":"ref14","first-page":"45","article-title":"Diagnosing intermittent faults","author":"de kleer","year":"2007","journal-title":"Proc Int Workshop Principles Diagnosis"},{"key":"ref15","article-title":"Online model-based diagnosis for multiple, intermittent and interaction faults","author":"kuhn","year":"0","journal-title":"Proc Annu Conf Prognostics Health Manage Soc"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSYST.2008.925262"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.2005958"},{"key":"ref18","first-page":"249","article-title":"Supervised machine learning: A review of classification techniques","volume":"31","author":"kotsiantis","year":"2007","journal-title":"Informatica"},{"key":"ref19","author":"quinlan","year":"1993","journal-title":"C4 5 Programs for Machine Learning"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1006\/jcss.1997.1504"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.4271\/2008-01-2932"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1023\/A:1023937123600"},{"key":"ref3","year":"2007","journal-title":"Diagnostic Trouble Code definitions"},{"key":"ref6","first-page":"3665","article-title":"Application of signal analysis and data-driven approaches to fault detection and diagnosis in automotive engines","author":"namburu","year":"2007","journal-title":"Proc IEEE Int Conf Syst Man Cybern"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1023\/A:1010933404324"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/12.54845"},{"key":"ref8","first-page":"2184","article-title":"Improving vehicle diagnostics through wireless data collection and statistical analysis","author":"johanson","year":"2007","journal-title":"Proc 66th IEEE Veh Technol Conf"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.2004340"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/S0026-2714(02)00040-9"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/COASE.2010.5584324"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/2.976923"},{"key":"ref20","first-page":"168","article-title":"Discovering rules by induction from large collections of examples","author":"quinlan","year":"1979","journal-title":"Expert Systems in the Microelectronic Age"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1023\/A:1009744630224"},{"key":"ref21","author":"breiman","year":"1984","journal-title":"Classification and Regression Trees"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TSMCC.2004.843247"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/21.97458"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1002\/0471660264"},{"key":"ref25","author":"witten","year":"2005","journal-title":"Data Mining Practical Machine Learning Modules and Techniques"}],"container-title":["IEEE Transactions on Systems, Man, and Cybernetics, Part C (Applications and Reviews)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5326\/6330018\/06392471.pdf?arnumber=6392471","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T23:50:41Z","timestamp":1633909841000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6392471\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,11]]},"references-count":31,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tsmcc.2012.2227143","relation":{},"ISSN":["1094-6977","1558-2442"],"issn-type":[{"value":"1094-6977","type":"print"},{"value":"1558-2442","type":"electronic"}],"subject":[],"published":{"date-parts":[[2012,11]]}}}