{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T10:14:08Z","timestamp":1740132848870,"version":"3.37.3"},"reference-count":24,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"am","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,1,1]],"date-time":"2024-01-01T00:00:00Z","timestamp":1704067200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000001","name":"National Science Foundation","doi-asserted-by":"publisher","award":["1932501"],"award-info":[{"award-number":["1932501"]}],"id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Signal Process."],"published-print":{"date-parts":[[2024]]},"DOI":"10.1109\/tsp.2024.3397560","type":"journal-article","created":{"date-parts":[[2024,5,7]],"date-time":"2024-05-07T17:42:02Z","timestamp":1715103722000},"page":"2421-2435","source":"Crossref","is-referenced-by-count":1,"title":["Adaptive Binning Coincidence Test for Uniformity Testing"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-1361-4565","authenticated-orcid":false,"given":"Sudeep","family":"Salgia","sequence":"first","affiliation":[{"name":"School of Electrical and Computer Engineering, Cornell University, Ithaca, NY, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2658-8650","authenticated-orcid":false,"given":"Xinyi","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Electrical and Computer Engineering, Cornell University, Ithaca, NY, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9590-4285","authenticated-orcid":false,"given":"Qing","family":"Zhao","sequence":"additional","affiliation":[{"name":"School of Electrical and Computer Engineering, Cornell University, Ithaca, NY, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3322-2681","authenticated-orcid":false,"given":"Lang","family":"Tong","sequence":"additional","affiliation":[{"name":"School of Electrical and Computer Engineering, Cornell University, Ithaca, NY, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1214\/aos\/1193342380"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1137\/1.9781611973075.6"},{"key":"ref3","first-page":"57","article-title":"A competitive test for uniformity of monotone distributions","volume-title":"J. Mach. Learn. Res.","volume":"31","author":"Acharya","year":"2013"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.2307\/2332152"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1137\/1111021"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2008.928987"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2013.2283266"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/SFCS.2001.959920"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/2432622.2432626"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-22670-0_9"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1137\/1.9781611973402.88"},{"key":"ref12","first-page":"41:1","article-title":"Sample-optimal identity testing with high probability","volume-title":"Leibniz Int. Proc. Inform. (LIPIcs)","volume":"107","author":"Diakonikolas","year":"2018"},{"key":"ref13","first-page":"3591","article-title":"Optimal testing for properties of distributions","volume-title":"Proc. Adv. Neural Inf. Process. Syst.","author":"Acharya","year":"2015"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.4086\/toc.gs.2020.009"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/FOCS.2017.86"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/tsp.2024.3397560"},{"key":"ref17","first-page":"11655","article-title":"Sequential algorithms for testing identity and closeness of distributions","volume-title":"Proc. 35th Annu. Conf. Neural Inf. Process. Syst.","volume":"34","author":"Fawzi","year":"2021"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1137\/1.9781611973730.123"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1007\/s00224-010-9265-8"},{"issue":"2","key":"ref20","first-page":"150","article-title":"Adaptive chi-square tests","volume":"244","author":"Ingster","year":"1997","journal-title":"Zapiski Nauchnykh Seminarov POMI"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ICASSP.2012.6288611"},{"volume-title":"Asymptotic Methods in Analysis","year":"1981","author":"Bruijn","key":"ref22"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TSTE.2016.2600103"},{"issue":"49","key":"ref24","first-page":"1","article-title":"Innovations autoencoder and its application in one-class anomalous sequence detection","volume":"23","author":"Wang","year":"2022","journal-title":"J. Mach. Learn. Res."}],"container-title":["IEEE Transactions on Signal Processing"],"original-title":[],"link":[{"URL":"https:\/\/ieeexplore.ieee.org\/ielam\/78\/10347386\/10521897-aam.pdf","content-type":"application\/pdf","content-version":"am","intended-application":"syndication"},{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/78\/10347386\/10521897.pdf?arnumber=10521897","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,6,7]],"date-time":"2024-06-07T04:38:29Z","timestamp":1717735109000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10521897\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/tsp.2024.3397560","relation":{},"ISSN":["1053-587X","1941-0476"],"issn-type":[{"type":"print","value":"1053-587X"},{"type":"electronic","value":"1941-0476"}],"subject":[],"published":{"date-parts":[[2024]]}}}