{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,9,13]],"date-time":"2023-09-13T19:31:50Z","timestamp":1694633510608},"reference-count":23,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2008,6,1]],"date-time":"2008-06-01T00:00:00Z","timestamp":1212278400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2008,6]]},"DOI":"10.1109\/tvlsi.2008.2000256","type":"journal-article","created":{"date-parts":[[2008,5,20]],"date-time":"2008-05-20T20:11:34Z","timestamp":1211314294000},"page":"714-724","source":"Crossref","is-referenced-by-count":1,"title":["Intelligent Robustness Insertion for Optimal Transient Error Tolerance Improvement in VLSI Circuits"],"prefix":"10.1109","volume":"16","author":[{"given":"Chong","family":"Zhao","sequence":"first","affiliation":[]},{"given":"Yi","family":"Zhao","sequence":"additional","affiliation":[]},{"given":"Sujit","family":"Dey","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1271075"},{"key":"ref11","first-page":"7","article-title":"separate dual transistor register-an circuit solution for on-line testing of transient errors in udsm-ic","author":"zhao","year":"2003","journal-title":"Proc IOLTS"},{"key":"ref12","first-page":"40.2","article-title":"a static noise-impact-analysis methodology for evaluating transient error effects in digital vlsi circuits","author":"zhao","year":"2005","journal-title":"Proc ITC"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2003.813129"},{"key":"ref14","article-title":"dosimirradiation measurements inside the soviet space station mirfirst results","author":"vana","year":"1992","journal-title":"Int Space Year Conf"},{"key":"ref15","first-page":"4.3.1","article-title":"probabilistic estimates of upset caused by single event transients","author":"hass","year":"1999","journal-title":"Proc 8th NASA Symp VLSI Des"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.1982.4336490"},{"key":"ref17","author":"carreno","year":"1990","journal-title":"Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system"},{"key":"ref18","first-page":"111","author":"hu","year":"2002","journal-title":"Combinatorial Algorithms"},{"key":"ref19","author":"cormen","year":"1990","journal-title":"Introduction to Algorithms"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2002.1003798"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2000.840845"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2006.887832"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/MC.2005.70"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2004.831449"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/23.556880"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2002.1028924"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/4.871318"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2005.274"},{"key":"ref20","year":"2001","journal-title":"Xtensa microprocessor overview handbook"},{"key":"ref22","doi-asserted-by":"crossref","first-page":"111","DOI":"10.1109\/OLT.2003.1214376","article-title":"a model for transient fault propagation in combinatorial logic","author":"omana","year":"2003","journal-title":"Proc 9th IEEE Int On-line Testing Symp"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297680"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1145\/1065579.1065631"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/92\/4526712\/04526717.pdf?arnumber=4526717","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,11,29]],"date-time":"2021-11-29T20:56:05Z","timestamp":1638219365000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4526717\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,6]]},"references-count":23,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2008.2000256","relation":{},"ISSN":["1063-8210"],"issn-type":[{"value":"1063-8210","type":"print"}],"subject":[],"published":{"date-parts":[[2008,6]]}}}