{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,13]],"date-time":"2025-10-13T19:48:42Z","timestamp":1760384922261},"reference-count":22,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2009,1,1]],"date-time":"2009-01-01T00:00:00Z","timestamp":1230768000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2009,1]]},"DOI":"10.1109\/tvlsi.2008.2003167","type":"journal-article","created":{"date-parts":[[2008,12,10]],"date-time":"2008-12-10T20:58:26Z","timestamp":1228942706000},"page":"55-65","source":"Crossref","is-referenced-by-count":63,"title":["Probabilistic Error Modeling for Nano-Domain Logic Circuits"],"prefix":"10.1109","volume":"17","author":[{"given":"T.","family":"Rejimon","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"K.","family":"Lingasubramanian","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Bhanja","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","author":"winograd","year":"1963","journal-title":"Reliable Computation in the Presence of Noise"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2004.837991"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2003.159745"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICVD.2005.46"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2005.1594200"},{"key":"ref15","author":"cheng","year":"2001","journal-title":"Efficient stochastic sampling algorithms for Bayesian networks"},{"key":"ref16","first-page":"624","article-title":"an importance sampling algorithm based on evidence pre-propagation","author":"yuan","year":"2003","journal-title":"Proc Ann Conf Uncertainty in Artificial Intelligence"},{"key":"ref17","doi-asserted-by":"crossref","first-page":"149","DOI":"10.1016\/B978-0-444-70396-5.50019-4","article-title":"propagation of uncertainty by probabilistic logic sampling in bayes' networks","volume":"2","author":"henrion","year":"1988","journal-title":"Uncertainty in Artificial Intelligence 3"},{"key":"ref18","first-page":"467","article-title":"loopy belief propagation for approximate inference: an empirical study","author":"murphy","year":"1999","journal-title":"Proc Uncertainty AI"},{"key":"ref19","year":"0","journal-title":"?GeNIE ?"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2005.47"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/13\/3\/323"},{"key":"ref6","doi-asserted-by":"crossref","first-page":"907","DOI":"10.1109\/ICVD.2004.1261046","article-title":"evaluating the reliability of defect-tolerant architectures for nanotechnology with probabilistic model checking","author":"noman","year":"2004","journal-title":"Proc Int Conf VLSI Des"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2003.159727"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/NANO.2005.1500703"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2005.851289"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/14\/2\/324"},{"key":"ref1","first-page":"582","article-title":"fault rates in nanochip devices","author":"spagocci","year":"1999","journal-title":"Electrochem Soc"},{"key":"ref9","first-page":"43","author":"von neumann","year":"1954","journal-title":"Automata Studies"},{"key":"ref20","author":"cowell","year":"1999","journal-title":"Probabilistic Networks and Expert Systems"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1145\/1142980.1142990"},{"key":"ref21","author":"pearl","year":"1988","journal-title":"Probabilistic Reasoning in Intelligent Systems Network of Plausible Inference"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/92\/4717837\/04703183.pdf?arnumber=4703183","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,11,29]],"date-time":"2021-11-29T20:56:08Z","timestamp":1638219368000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4703183\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,1]]},"references-count":22,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2008.2003167","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"value":"1063-8210","type":"print"},{"value":"1557-9999","type":"electronic"}],"subject":[],"published":{"date-parts":[[2009,1]]}}}