{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,23]],"date-time":"2026-01-23T12:41:07Z","timestamp":1769172067144,"version":"3.49.0"},"reference-count":19,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[2009,9,1]],"date-time":"2009-09-01T00:00:00Z","timestamp":1251763200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2009,9]]},"DOI":"10.1109\/tvlsi.2008.2003511","type":"journal-article","created":{"date-parts":[[2009,3,12]],"date-time":"2009-03-12T13:47:20Z","timestamp":1236865640000},"page":"1187-1195","source":"Crossref","is-referenced-by-count":88,"title":["An Analytical Model for Soft Error Critical Charge of Nanometric SRAMs"],"prefix":"10.1109","volume":"17","author":[{"given":"S.M.","family":"Jahinuzzaman","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Sharifkhani","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Sachdev","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2002.1033788"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/23.915368"},{"key":"ref12","first-page":"294","article-title":"process impact on sram alpha-particle seu performance","author":"xu","year":"2004","journal-title":"Proc IEEE Int Rel Phys Symp"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2006.320052"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2007.4405722"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.1994.307864"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1145\/566408.566422"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2004.1283723"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.1998.746324"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1584045"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2006.876104"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2003.821593"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/23.819093"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.1993.347273"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2001.929760"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/23.903813"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TDSC.2004.14"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2005.69"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/0-387-46547-2"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/92\/5208586\/04799184.pdf?arnumber=4799184","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,11]],"date-time":"2021-10-11T00:00:25Z","timestamp":1633910425000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4799184\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,9]]},"references-count":19,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2008.2003511","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"value":"1063-8210","type":"print"},{"value":"1557-9999","type":"electronic"}],"subject":[],"published":{"date-parts":[[2009,9]]}}}