{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,9,13]],"date-time":"2023-09-13T20:45:25Z","timestamp":1694637925619},"reference-count":13,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2011,3,1]],"date-time":"2011-03-01T00:00:00Z","timestamp":1298937600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2011,3]]},"DOI":"10.1109\/tvlsi.2009.2036266","type":"journal-article","created":{"date-parts":[[2009,12,11]],"date-time":"2009-12-11T17:58:53Z","timestamp":1260554333000},"page":"508-512","source":"Crossref","is-referenced-by-count":3,"title":["Runtime Resonance Noise Reduction with Current Prediction Enabled Frequency Actuator"],"prefix":"10.1109","volume":"19","author":[{"given":"Yiyu","family":"Shi","sequence":"first","affiliation":[]},{"given":"Jinjun","family":"Xiong","sequence":"additional","affiliation":[]},{"given":"Howard","family":"Chen","sequence":"additional","affiliation":[]},{"given":"Lei","family":"He","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1999.781236"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/6040.938289"},{"key":"ref12","first-page":"286","article-title":"on-die supply-resonance suppression using band-limited active damping","author":"xu","year":"2007","journal-title":"Proc IEEE Int Solid State Circuits Conf"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1146967"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IWSOC.2003.1213049"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/EURDAC.1992.246218"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2009.4796509"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2002.998271"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2003.809658"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2008.923636"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/EPEP.1995.524885"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2000.839850"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.1999.780800"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/92\/5719054\/05352254.pdf?arnumber=5352254","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,11]],"date-time":"2021-10-11T01:00:21Z","timestamp":1633914021000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5352254\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,3]]},"references-count":13,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2009.2036266","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"value":"1063-8210","type":"print"},{"value":"1557-9999","type":"electronic"}],"subject":[],"published":{"date-parts":[[2011,3]]}}}