{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,9,13]],"date-time":"2023-09-13T21:13:24Z","timestamp":1694639604982},"reference-count":22,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[2011,9,1]],"date-time":"2011-09-01T00:00:00Z","timestamp":1314835200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2011,9]]},"DOI":"10.1109\/tvlsi.2010.2055589","type":"journal-article","created":{"date-parts":[[2010,8,10]],"date-time":"2010-08-10T15:00:05Z","timestamp":1281452405000},"page":"1597-1609","source":"Crossref","is-referenced-by-count":16,"title":["Inquisitive Defect Cache: A Means of Combating Manufacturing Induced Process Variation"],"prefix":"10.1109","volume":"19","author":[{"given":"Avesta","family":"Sasan","sequence":"first","affiliation":[]},{"given":"Houman","family":"Homayoun","sequence":"additional","affiliation":[]},{"given":"Ahmed M.","family":"Eltawil","sequence":"additional","affiliation":[]},{"given":"Fadi","family":"Kurdahi","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/4.126538"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.852159"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ISCA.2008.22"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/4.913744"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2003.1253701"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2009.2016714"},{"key":"ref16","doi-asserted-by":"crossref","first-page":"148","DOI":"10.1109\/ISCA.2002.1003572","article-title":"Drowsy caches: Simple techniques for reducing leakage power","author":"flautner","year":"2002","journal-title":"Proc 29th Annu Int Symp Comput Arch"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1145\/1450095.1450125"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.1990.124781"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2005.859588"},{"key":"ref4","year":"2010","journal-title":"CACTI An Integrated Cache and Memory Access Time Cycle Time Area Leakage and Dynamic Power Model"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2007.4601943"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/0165-6074(95)00004-8"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1999.766701"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/12.210168"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/12.21141"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2007.53"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.852295"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/MTDT.1994.397197"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/92.645063"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2002.1012781"},{"key":"ref21","first-page":"32","article-title":"45 nm\/32 nm CMOS challenge and perspective","author":"ishimaru","year":"2007","journal-title":"Proc 35th Eur Solid-State Device Research Conf (ESSDERC'05)"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/92\/5961802\/05540313.pdf?arnumber=5540313","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,11]],"date-time":"2021-10-11T00:43:30Z","timestamp":1633913010000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5540313\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,9]]},"references-count":22,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2010.2055589","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"value":"1063-8210","type":"print"},{"value":"1557-9999","type":"electronic"}],"subject":[],"published":{"date-parts":[[2011,9]]}}}