{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,3,31]],"date-time":"2022-03-31T21:29:35Z","timestamp":1648762175340},"reference-count":23,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2012,1,1]],"date-time":"2012-01-01T00:00:00Z","timestamp":1325376000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2012,1]]},"DOI":"10.1109\/tvlsi.2010.2090544","type":"journal-article","created":{"date-parts":[[2012,3,16]],"date-time":"2012-03-16T19:28:12Z","timestamp":1331926092000},"page":"89-97","source":"Crossref","is-referenced-by-count":1,"title":["Worst-Case Estimation for Data-Dependent Timing Jitter and Amplitude Noise in High-Speed Differential Link"],"prefix":"10.1109","volume":"20","author":[{"given":"Wei","family":"Yao","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yiyu","family":"Shi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lei","family":"He","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sudhakar","family":"Pamarti","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2007.4405866"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ISSE.2007.4432917"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/MWSYM.2004.1338895"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2004.834537"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2004.34"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2008.4681646"},{"key":"ref16","article-title":"Broadband impedance parameters of symmetric coupled coplanar CMOS interconnects","author":"ymeri","year":"2003","journal-title":"Electrotechn Rev"},{"key":"ref17","author":"paul","year":"2006","journal-title":"Introduction to Electromagnetic Compatibility"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/5.929650"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/43.124421"},{"key":"ref4","author":"haykin","year":"2000","journal-title":"Communication Systems"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2005.1568692"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2005.855101"},{"key":"ref5","first-page":"50","article-title":"Analyzing signals using the eye diagram","author":"breed","year":"2005","journal-title":"High Frequency Electron"},{"key":"ref8","first-page":"725","article-title":"A signal integrity-based link performance simulation platform","author":"tao","year":"2005","journal-title":"Proc IEEE Custom Integr Circuits Conf"},{"key":"ref7","doi-asserted-by":"crossref","first-page":"912","DOI":"10.1049\/el:20040567","article-title":"Fir filter optimisation as pre-emphasis of high-speed backplane data transmission","volume":"40","author":"li","year":"2004","journal-title":"Electron Lett"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2003.1249467"},{"key":"ref1","article-title":"Worst case timing jitter and amplitude noise in differential signaling","author":"yao","year":"2009","journal-title":"Proc Int Symp Quality Electron Design (ISQED)"},{"key":"ref9","first-page":"721","article-title":"Compensation of undesired channel effects by frequency domain optimization of pre-emphasis filter for over gbps signaling","volume":"3","author":"kim","year":"2006","journal-title":"Proc IEEE Int Symp Electromagn Compatibil"},{"key":"ref20","doi-asserted-by":"crossref","first-page":"285","DOI":"10.1109\/DFTVS.2005.52","article-title":"On the modeling and analysis of jitter in ate using matlab","author":"kim","year":"2005","journal-title":"Proc IEEE Int Symp Defect Fault Toler VLSI Syst"},{"key":"ref22","first-page":"1","article-title":"Translating pseudo-Boolean constraints into sat","volume":"2","author":"een","year":"2006","journal-title":"JSAT"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/96.659513"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1142\/S0129156405003259"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/92\/6099858\/05667076.pdf?arnumber=5667076","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T23:47:47Z","timestamp":1633909667000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5667076\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,1]]},"references-count":23,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2010.2090544","relation":{},"ISSN":["1063-8210"],"issn-type":[{"value":"1063-8210","type":"print"}],"subject":[],"published":{"date-parts":[[2012,1]]}}}