{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,4]],"date-time":"2025-11-04T10:22:35Z","timestamp":1762251755318},"reference-count":25,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2012,6,1]],"date-time":"2012-06-01T00:00:00Z","timestamp":1338508800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2012,6]]},"DOI":"10.1109\/tvlsi.2011.2138729","type":"journal-article","created":{"date-parts":[[2011,5,3]],"date-time":"2011-05-03T14:06:26Z","timestamp":1304431586000},"page":"1026-1035","source":"Crossref","is-referenced-by-count":12,"title":["Gradual Diagnostic Test Generation and Observation Point Insertion Based on the Structural Distance Between Indistinguished Fault Pairs"],"prefix":"10.1109","volume":"20","author":[{"given":"Irith","family":"Pomeranz","sequence":"first","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2008.44"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1990.114000"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1991.185229"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/EDTC.1995.470385"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743306"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-005-1543-z"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI.Design.2010.13"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/43.476580"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1387447"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1387446"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041765"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966644"},{"key":"ref6","doi-asserted-by":"crossref","first-page":"7","DOI":"10.1109\/ETS.2007.9","article-title":"Adaptive debug and diagnosis without fault dictionaries","author":"holst","year":"2007","journal-title":"Proc Eur Test Symp"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2003.1240895"},{"key":"ref8","first-page":"367","article-title":"Precise failure localization using automated layout analysis of diagnosis candidates","author":"tarn","year":"2008","journal-title":"Proc Des Autom Conf"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/1391469.1391567"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894213"},{"key":"ref9","first-page":"1","article-title":"An effective and flexible multiple defect diagnosis methodology using error propagation analysis","author":"yu","year":"2008","journal-title":"Proc Int Test Conf"},{"key":"ref1","author":"abramovici","year":"1995","journal-title":"Digital Systems Testing and Testable Design"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2010.49"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1996.557029"},{"key":"ref21","author":"cormen","year":"2001","journal-title":"Introduction to Algorithms"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966662"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639630"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1386985"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/92\/6196243\/05756475.pdf?arnumber=5756475","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T23:52:01Z","timestamp":1633909921000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5756475\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,6]]},"references-count":25,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2011.2138729","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"value":"1063-8210","type":"print"},{"value":"1557-9999","type":"electronic"}],"subject":[],"published":{"date-parts":[[2012,6]]}}}