{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,12]],"date-time":"2026-02-12T11:35:40Z","timestamp":1770896140986,"version":"3.50.1"},"reference-count":15,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"10","license":[{"start":{"date-parts":[[2012,10,1]],"date-time":"2012-10-01T00:00:00Z","timestamp":1349049600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2012,10]]},"DOI":"10.1109\/tvlsi.2011.2163651","type":"journal-article","created":{"date-parts":[[2011,9,21]],"date-time":"2011-09-21T19:57:12Z","timestamp":1316635032000},"page":"1890-1894","source":"Crossref","is-referenced-by-count":6,"title":["Functional Test-Sequence Grading at Register-Transfer Level"],"prefix":"10.1109","volume":"20","author":[{"given":"Hongxia","family":"Fang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Krishnendu","family":"Chakrabarty","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Abhijit","family":"Jas","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Srinivas","family":"Patil","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chandra","family":"Tirumurti","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2005.82"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2008.4700613"},{"key":"ref12","author":"chalmers","year":"1987","journal-title":"Understanding Statistics"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1271091"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2009.12"},{"key":"ref15","author":"kalton","year":"1983","journal-title":"SAGE University Paper Series on Quantitative Applications in the Social Sciences Series 07-035"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2007.18"},{"key":"ref3","first-page":"1","article-title":"A functional coverage metric for estimating the gate-level fault foverage of functional tests","author":"park","year":"2006","journal-title":"Proc Int Test Conf"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2007.907228"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2011.2163651"},{"key":"ref8","author":"navabi","year":"1997","journal-title":"VHDL Analysis and Modeling of Digital Systems"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2008.2009166"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1583984"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894231"},{"key":"ref9","year":"2009","journal-title":"Biquad infinite impulse response filter"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/92\/6246737\/06016226.pdf?arnumber=6016226","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T23:49:43Z","timestamp":1633909783000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6016226\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,10]]},"references-count":15,"journal-issue":{"issue":"10"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2011.2163651","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"value":"1063-8210","type":"print"},{"value":"1557-9999","type":"electronic"}],"subject":[],"published":{"date-parts":[[2012,10]]}}}