{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,1]],"date-time":"2024-09-01T05:06:04Z","timestamp":1725167164076},"reference-count":21,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"10","license":[{"start":{"date-parts":[[2012,10,1]],"date-time":"2012-10-01T00:00:00Z","timestamp":1349049600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2012,10]]},"DOI":"10.1109\/tvlsi.2011.2163953","type":"journal-article","created":{"date-parts":[[2011,12,13]],"date-time":"2011-12-13T19:19:39Z","timestamp":1323803979000},"page":"1835-1848","source":"Crossref","is-referenced-by-count":38,"title":["A New Self-Healing Methodology for RF Amplifier Circuits Based on Oscillation Principles"],"prefix":"10.1109","volume":"20","author":[{"given":"Abhilash","family":"Goyal","sequence":"first","affiliation":[]},{"given":"Madhavan","family":"Swaminathan","sequence":"additional","affiliation":[]},{"given":"Abhijit","family":"Chatterjee","sequence":"additional","affiliation":[]},{"given":"Duane C.","family":"Howard","sequence":"additional","affiliation":[]},{"given":"John D.","family":"Cressler","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/43.644035"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2004.1299267"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2031381"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-009-5126-2"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2009.5090929"},{"key":"ref15","author":"razavi","year":"1997","journal-title":"RF Microelectronics"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1214\/aos\/1176347963"},{"key":"ref17","author":"haykin","year":"1992","journal-title":"Neural NetworksA Comprehensive Foundation"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/43.986428"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2002.998268"},{"key":"ref4","year":"2007","journal-title":"2007 Edition of the International Technology Roadmap for Semiconductors (ITRS)"},{"key":"ref3","article-title":"How Designers can Increase Parametric Yield","author":"najibi","year":"2003","journal-title":"EE Times"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2005.853893"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041908"},{"key":"ref8","first-page":"311","article-title":"A self-healing 2.4 GHz LNA with on-chip S11\/S21 measurement\/calibration for in-situ PVT compensation","author":"jayaraman","year":"2010","journal-title":"Proc IEEE Rad Freq Integr Circuits (RFIC) Symp"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2008.2009454"},{"key":"ref2","article-title":"Yield, packages hang up design below 100 nm","author":"goering","year":"2003","journal-title":"EE Times"},{"key":"ref1","year":"2008","journal-title":"Broad Agency Announcement"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/19.779176"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297705"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/22.179894"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/92\/6246737\/06104211.pdf?arnumber=6104211","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T23:49:33Z","timestamp":1633909773000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6104211\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,10]]},"references-count":21,"journal-issue":{"issue":"10"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2011.2163953","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"value":"1063-8210","type":"print"},{"value":"1557-9999","type":"electronic"}],"subject":[],"published":{"date-parts":[[2012,10]]}}}