{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,25]],"date-time":"2026-03-25T05:27:02Z","timestamp":1774416422417,"version":"3.50.1"},"reference-count":25,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2013,4,1]],"date-time":"2013-04-01T00:00:00Z","timestamp":1364774400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2013,4]]},"DOI":"10.1109\/tvlsi.2012.2195689","type":"journal-article","created":{"date-parts":[[2012,5,29]],"date-time":"2012-05-29T19:59:37Z","timestamp":1338321577000},"page":"614-623","source":"Crossref","is-referenced-by-count":25,"title":["Test Patterns of Multiple SIC Vectors: Theory and Application in BIST Schemes"],"prefix":"10.1109","volume":"21","author":[{"given":"Feng","family":"Liang","sequence":"first","affiliation":[]},{"given":"Luwen","family":"Zhang","sequence":"additional","affiliation":[]},{"given":"Shaochong","family":"Lei","sequence":"additional","affiliation":[]},{"given":"Guohe","family":"Zhang","sequence":"additional","affiliation":[]},{"given":"Kaile","family":"Gao","sequence":"additional","affiliation":[]},{"given":"Bin","family":"Liang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/988952.989052"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2004.842885"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/1497561.1497571"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1999.766696"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1023\/A:1008331029249"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ETW.1999.804523"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805616"},{"key":"ref17","first-page":"49","article-title":"Low power serial built-in self-test","author":"hertwing","year":"1998","journal-title":"Proc Eur Test Workshop"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2007.358089"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2002.1106815"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.1999.777817"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2015736"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2000.843823"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2002.1013896"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2000.843822"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2001.923454"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2002.1003802"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2001.990291"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1993.313316"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.855927"},{"key":"ref22","first-page":"416","article-title":"POWERTEST: A tool for energy conscious weighted random pattern testing","author":"zhang","year":"1999","journal-title":"Proc 12th Int Conf VLSI Design"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2007.70794"},{"key":"ref24","first-page":"647","article-title":"A new low energy BIST using a statistical code","author":"chun","year":"2008","journal-title":"Proc Asia South Pacific Design Autom Conf"},{"key":"ref23","first-page":"689","article-title":"Multi-degree smoother for low power consumption in single and multiple scan-chains BIST","author":"abdallatif","year":"2010","journal-title":"Proc Int Symp Quality Electronic Design"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2009.4810302"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/92\/6481519\/06199995.pdf?arnumber=6199995","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,12,23]],"date-time":"2021-12-23T09:26:25Z","timestamp":1640251585000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6199995\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,4]]},"references-count":25,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2012.2195689","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"value":"1063-8210","type":"print"},{"value":"1557-9999","type":"electronic"}],"subject":[],"published":{"date-parts":[[2013,4]]}}}