{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,10]],"date-time":"2026-01-10T18:35:53Z","timestamp":1768070153354,"version":"3.49.0"},"reference-count":16,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2013,6,1]],"date-time":"2013-06-01T00:00:00Z","timestamp":1370044800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2013,6]]},"DOI":"10.1109\/tvlsi.2012.2205027","type":"journal-article","created":{"date-parts":[[2012,7,25]],"date-time":"2012-07-25T18:04:55Z","timestamp":1343239495000},"page":"1116-1128","source":"Crossref","is-referenced-by-count":22,"title":["Per-Device Adaptive Test for Analog\/RF Circuits Using Entropy-Based Process Monitoring"],"prefix":"10.1109","volume":"21","author":[{"given":"Ender","family":"Yilmaz","sequence":"first","affiliation":[]},{"given":"Sule","family":"Ozev","sequence":"additional","affiliation":[]},{"given":"Kenneth M.","family":"Butler","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1999.766700"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2005.277"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297706"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-009-5113-7"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2008.4751867"},{"key":"ref15","author":"scott","year":"2008","journal-title":"Multivariate Density Estimation Theory Practice and Visualization"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2016136"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2003.1240924"},{"key":"ref3","author":"cormen","year":"1997","journal-title":"Introduction to Algorithms"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2008.35"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2007.41"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/82.728852"},{"key":"ref7"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2008.4751866"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/1629911.1630098"},{"key":"ref9","doi-asserted-by":"crossref","first-page":"494","DOI":"10.1145\/127601.127718","article-title":"Optimal ordering of analog integrated circuit tests to minimize test time","author":"huss","year":"1991","journal-title":"28th ACM\/IEEE Design Automation Conference DAC"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/92\/6517540\/06248732.pdf?arnumber=6248732","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,11,29]],"date-time":"2021-11-29T20:56:16Z","timestamp":1638219376000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6248732\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,6]]},"references-count":16,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2012.2205027","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"value":"1063-8210","type":"print"},{"value":"1557-9999","type":"electronic"}],"subject":[],"published":{"date-parts":[[2013,6]]}}}