{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,9]],"date-time":"2026-01-09T20:57:00Z","timestamp":1767992220477,"version":"3.49.0"},"reference-count":20,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[2013,8,1]],"date-time":"2013-08-01T00:00:00Z","timestamp":1375315200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2013,8]]},"DOI":"10.1109\/tvlsi.2012.2211629","type":"journal-article","created":{"date-parts":[[2012,9,1]],"date-time":"2012-09-01T19:14:08Z","timestamp":1346526848000},"page":"1568-1572","source":"Crossref","is-referenced-by-count":8,"title":["New Approach to VLSI Buffer Modeling, Considering Overshooting Effect"],"prefix":"10.1109","volume":"21","author":[{"given":"Milad","family":"Mehri","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mohammad Hossein Mazaheri","family":"Kouhani","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Nasser","family":"Masoumi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Reza","family":"Sarvari","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","first-page":"615","article-title":"Short-circuit energy dissipation model for sub-100 nm CMOS buffers","author":"bisdounis","year":"2010","journal-title":"Proc IEEE Int Conf Electron Circuits Syst"},{"key":"ref11","first-page":"342","article-title":"The impact of modeling the overshooting effect in subthreshold region for nano-scale CMOS inverter","author":"bani-ahmed","year":"2011","journal-title":"Proc Int Conf Innov Inf Technol"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/4.293109"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/4.736655"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2035539"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2009.5118433"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1049\/ip-cds:20041016"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/DSD.2003.1231914"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2006.884077"},{"key":"ref19","year":"2011","journal-title":"Predictive Technology Model"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2003.1206250"},{"key":"ref3","doi-asserted-by":"crossref","first-page":"222","DOI":"10.1109\/SBCCI.2000.876034","article-title":"Modeling of short circuit power consumption using timing-only logic cell macro-models","author":"costa","year":"2000","journal-title":"Proc 13th Symp Integr Circuits Syst Des"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/81.662699"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/4.400428"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/81.883330"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/43.736183"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/4.792617"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/4.52187"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/43.992767"},{"key":"ref20","author":"rabaey","year":"2003","journal-title":"Digital Integrated Circuits"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/92\/6565423\/06293911.pdf?arnumber=6293911","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,11,29]],"date-time":"2021-11-29T20:56:17Z","timestamp":1638219377000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6293911\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,8]]},"references-count":20,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2012.2211629","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"value":"1063-8210","type":"print"},{"value":"1557-9999","type":"electronic"}],"subject":[],"published":{"date-parts":[[2013,8]]}}}