{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,22]],"date-time":"2025-12-22T05:23:45Z","timestamp":1766381025409},"reference-count":26,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2014,2,1]],"date-time":"2014-02-01T00:00:00Z","timestamp":1391212800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2014,2]]},"DOI":"10.1109\/tvlsi.2013.2240323","type":"journal-article","created":{"date-parts":[[2013,2,20]],"date-time":"2013-02-20T21:53:36Z","timestamp":1361397216000},"page":"280-285","source":"Crossref","is-referenced-by-count":9,"title":["Use of SSTA Tools for Evaluating BTI Impact on Combinational Circuits"],"prefix":"10.1109","volume":"22","author":[{"given":"Vinicius V. A.","family":"Camargo","sequence":"first","affiliation":[]},{"given":"Ben","family":"Kaczer","sequence":"additional","affiliation":[]},{"given":"Gilson","family":"Wirth","sequence":"additional","affiliation":[]},{"given":"Tibor","family":"Grasser","sequence":"additional","affiliation":[]},{"given":"Guido","family":"Groeseneken","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","first-page":"735","article-title":"An efficient method to identify critical gates under circuit aging","author":"wang","year":"2007","journal-title":"Proc IEEE\/ACM Int Conf Comput -Aided Design"},{"key":"ref11","first-page":"370","article-title":"NBTI-aware synthesis of digital circuits","author":"kumar","year":"2007","journal-title":"Proc 44th ACM\/IEEE Design Autom Conf"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/1629911.1630044"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2009.2026389"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1116\/1.3532947"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2010.5488859"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2010.5488858"},{"key":"ref17","author":"parrat","year":"1961","journal-title":"Probability and Experimental Errors in Science"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.3758\/s13428-010-0044-x"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2006.884077"},{"key":"ref4","year":"2008","journal-title":"Si2 Effective Current Source Model (ECSM) Statistical Extensions Specification"},{"key":"ref3","year":"2007","journal-title":"Statistical Methods for Semiconductor Chip Design"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2010.5488856"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1063\/1.1567461"},{"key":"ref8","first-page":"158","article-title":"NBTI-aware statistical timing analysis framework","author":"sangwoo","year":"2010","journal-title":"Proc IEEE Int SOC Conf"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2011.5784604"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2007.907047"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2003.815862"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2008.2008810"},{"key":"ref20","first-page":"437","author":"yadolah","year":"2008","journal-title":"The Concise Encyclopedia of Statistics"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2007.910437"},{"key":"ref21","first-page":"512","article-title":"Correlation analysis of the statistical electrical parameter fluctuations in 50 nm MOS-transistors","author":"horstmann","year":"1998","journal-title":"Proc 28th Eur Solid-State Device Res Conf"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2010.2043694"},{"key":"ref23","first-page":"325","author":"grinstead","year":"1997","journal-title":"Introduction to Probability"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2011.2157843"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2007.907241"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/92\/6716075\/06466436.pdf?arnumber=6466436","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:31:42Z","timestamp":1642005102000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6466436\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,2]]},"references-count":26,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2013.2240323","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"value":"1063-8210","type":"print"},{"value":"1557-9999","type":"electronic"}],"subject":[],"published":{"date-parts":[[2014,2]]}}}