{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,4]],"date-time":"2025-11-04T10:27:53Z","timestamp":1762252073091,"version":"3.41.2"},"reference-count":18,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2014,4,1]],"date-time":"2014-04-01T00:00:00Z","timestamp":1396310400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2014,4,1]],"date-time":"2014-04-01T00:00:00Z","timestamp":1396310400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2014,4,1]],"date-time":"2014-04-01T00:00:00Z","timestamp":1396310400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2014,4]]},"DOI":"10.1109\/tvlsi.2013.2257903","type":"journal-article","created":{"date-parts":[[2014,3,18]],"date-time":"2014-03-18T14:04:22Z","timestamp":1395151462000},"page":"947-951","source":"Crossref","is-referenced-by-count":20,"title":["Thwarting Scan-Based Attacks on Secure-ICs With On-Chip Comparison"],"prefix":"10.1109","volume":"22","author":[{"given":"Jean Da","family":"Rolt","sequence":"first","affiliation":[{"name":"Centre National de la Recherche Scientifique, Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier, Montpellier, France"}]},{"given":"Giorgio","family":"Di Natale","sequence":"additional","affiliation":[{"name":"Centre National de la Recherche Scientifique, Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier, Montpellier, France"}]},{"given":"Marie-Lise","family":"Flottes","sequence":"additional","affiliation":[{"name":"Centre National de la Recherche Scientifique, Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier, Montpellier, France"}]},{"given":"Bruno","family":"Rouzeyre","sequence":"additional","affiliation":[{"name":"Centre National de la Recherche Scientifique, Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier, Montpellier, France"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2005.36"},{"key":"ref11","doi-asserted-by":"crossref","first-page":"219","DOI":"10.1109\/OLT.2004.1319691","article-title":"Scan design and secure chip [secure IC testing]","author":"hely","year":"2004","journal-title":"Proc IEEE Int On-Line Test Symp"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2007.906483"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2010.5419845"},{"key":"ref14","first-page":"110","article-title":"New security threats against chips containing scan chain structures","author":"rolt","year":"2011","journal-title":"Proc IEEE Int Symp Hardw -Oriented Security Trust"},{"key":"ref15","first-page":"461","article-title":"Effects of embedded decompression and compaction architectures on side-channel attack resistance","author":"chunsheng","year":"2007","journal-title":"Proc IEEE VLSI Test Symp"},{"key":"ref16","doi-asserted-by":"crossref","first-page":"388","DOI":"10.1007\/3-540-48405-1_25","article-title":"Differential power analysis","author":"kocher","year":"1999","journal-title":"International Cryptology Conference on Advances in Cryptology"},{"key":"ref17","doi-asserted-by":"crossref","first-page":"293","DOI":"10.1007\/978-3-540-45203-4_23","volume":"2846","author":"dusart","year":"2003","journal-title":"Applied Cryptography and Network Security"},{"key":"ref18","first-page":"188","article-title":"Information leakage of flip-flops in DPA-resistant logic styles","author":"moradi","year":"2008","journal-title":"IACR Cryptology ePrint Archive"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2009.17"},{"key":"ref3","doi-asserted-by":"crossref","first-page":"327","DOI":"10.1109\/TCAD.2002.807889","article-title":"Testing ASICs with multiple identical cores","volume":"22","author":"wu","year":"2003","journal-title":"IEEE Trans Comput -Aided Design Integr Circuits Syst"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cdt:20060129"},{"journal-title":"System and method for wirelessly testing integrated circuits","year":"2011","key":"ref5"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2010.9"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2010.2089071"},{"key":"ref2","first-page":"339","article-title":"Scan based side channel attack on dedicated hardware implementations of data encryption standard","author":"yang","year":"2004","journal-title":"Proc IEEE Int Test Conf"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.862745"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2010.5513119"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/92\/6774899\/06515126.pdf?arnumber=6515126","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,22]],"date-time":"2025-07-22T18:09:31Z","timestamp":1753207771000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/6515126\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,4]]},"references-count":18,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2013.2257903","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"type":"print","value":"1063-8210"},{"type":"electronic","value":"1557-9999"}],"subject":[],"published":{"date-parts":[[2014,4]]}}}