{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,9,14]],"date-time":"2026-09-14T03:06:41Z","timestamp":1789355201031,"version":"build-2803163510"},"reference-count":29,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"7","license":[{"start":{"date-parts":[[2014,7,1]],"date-time":"2014-07-01T00:00:00Z","timestamp":1404172800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"name":"Mid-Career Researcher Program","award":["2011-0015702"],"award-info":[{"award-number":["2011-0015702"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2014,7]]},"DOI":"10.1109\/tvlsi.2013.2275161","type":"journal-article","created":{"date-parts":[[2013,8,27]],"date-time":"2013-08-27T18:01:38Z","timestamp":1377626498000},"page":"1548-1556","source":"Crossref","is-referenced-by-count":14,"title":["High Fill Factor Low-Voltage CMOS Image Sensor Based on Time-to-Threshold PWM VLSI Architecture"],"prefix":"10.1109","volume":"22","author":[{"given":"Kyoungrok","family":"Cho","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Sang-Jin","family":"Lee","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Omid","family":"Kavehei","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Kamran","family":"Eshraghian","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","author":"ohta","year":"2008","journal-title":"Smart CMOS Image Sensors and Applications"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/92.532033"},{"key":"ref12","author":"rochas","year":"2003","journal-title":"Single photon avalanche diodes in CMOS technology"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.848173"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2002.807412"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2007.900937"},{"key":"ref16","first-page":"2289","article-title":"A second generation time-to-first-spike pixel with asynchronous self power-off","author":"chen","year":"0","journal-title":"Proc IEEE ISCAS"},{"key":"ref17","first-page":"54","article-title":"A 3.6 ${\\rm pW\/frame}\\cdot{\\rm pixel}$ 1.35 V PWM CMOS imager with dynamic pixel readout and no static bias current","author":"kagawa","year":"0","journal-title":"Proc IEEE ISSCC Conf"},{"key":"ref18","first-page":"114","article-title":"A 0.5 V 4.95 $\\mu{\\rm W}$ 11.8 fps PWM CMOS imager with 82 dB dynamic range and 0.055% fixed-pattern noise","author":"chung","year":"0","journal-title":"Proc IEEE ISSCC Conf"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2040231"},{"key":"ref28","first-page":"286","article-title":"Robust intermediate read-out for deep submicron technology CMOS image sensors","volume":"8","author":"chen","year":"2010","journal-title":"IEEE Sensors J"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.895671"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2144010"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/LPT.2010.2063421"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2002.1010386"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2005.863193"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2006.873615"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2004.831222"},{"key":"ref7","first-page":"85","article-title":"A 142 dB dynamic range CMOS image sensor with multiple exposure time signals","author":"park","year":"0","journal-title":"Proc Asian Solid-State Circuits Conf"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2006.888679"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2006.870144"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2144130"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2009.2035453"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2009.09.003"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1117\/12.463435"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2085910"},{"key":"ref23","first-page":"101","article-title":"CMOS digital cameras need new figures of merit","volume":"35","author":"fossum","year":"1999","journal-title":"Laser Focus World"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2012.2213359"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2012.2190936"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/92\/6841655\/06587305.pdf?arnumber=6587305","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:17:30Z","timestamp":1642004250000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6587305\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,7]]},"references-count":29,"journal-issue":{"issue":"7"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2013.2275161","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"value":"1063-8210","type":"print"},{"value":"1557-9999","type":"electronic"}],"subject":[],"published":{"date-parts":[[2014,7]]}}}