{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,12,31]],"date-time":"2022-12-31T18:50:33Z","timestamp":1672512633455},"reference-count":50,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2015,3,1]],"date-time":"2015-03-01T00:00:00Z","timestamp":1425168000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"name":"EU"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2015,3]]},"DOI":"10.1109\/tvlsi.2014.2309663","type":"journal-article","created":{"date-parts":[[2014,4,7]],"date-time":"2014-04-07T21:23:28Z","timestamp":1396905808000},"page":"507-519","source":"Crossref","is-referenced-by-count":3,"title":["Demonstrating HW\u2013SW Transient Error Mitigation on the Single-Chip Cloud Computer Data Plane"],"prefix":"10.1109","volume":"23","author":[{"given":"Dimitrios","family":"Rodopoulos","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Antonis","family":"Papanikolaou","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Francky","family":"Catthoor","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dimitrios","family":"Soudris","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2007.346196"},{"key":"ref38","author":"mukherjee","year":"2008","journal-title":"Architecture Design for Soft Errors"},{"key":"ref33","year":"2013","journal-title":"Intel xeon phi coprocessor–system software developers guide"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/SC.2010.53"},{"key":"ref31","author":"miano","year":"1999","journal-title":"Compressed Image File Formats JPEG PNG GIF XBM BMP"},{"key":"ref30","author":"kumar","year":"2009","journal-title":"Analysis Design and Management of Multimedia Multiprocessor Systems"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2013.2259503"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2010.5416629"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TDSC.2004.2"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1145\/2228360.2228568"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/RTCSA.2012.60"},{"key":"ref27","author":"press","year":"1992","journal-title":"Numerical Recipes in C—The Art of Scientific Computing"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-15291-7_31"},{"key":"ref2","first-page":"145","article-title":"Transient and permanent error co-management method for reliable networks-on-chip","author":"qiaoyan","year":"2010","journal-title":"Proc 4th ACM\/IEEE Int Symp Netw Chip"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2005.110"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ICICDT.2007.4299574"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2010.5456961"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2010.5456959"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1147041"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2006.874355"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9780511744839"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ISCA.2004.1310780"},{"key":"ref50","author":"pareto","year":"1971","journal-title":"Manual of Political Economy"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2079450"},{"key":"ref11","first-page":"77","article-title":"Software mitigation of transient errors on the single-chip cloud computer","author":"rodopoulos","year":"2012","journal-title":"Proc IEEE SELSE Workshop"},{"key":"ref40","author":"gonzalez","year":"1993","journal-title":"Digital Image Processing"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2004.836294"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2007.4342772"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ARMS.1989.49600"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/800046.801651"},{"key":"ref16","first-page":"2517","article-title":"45 nm low-power embedded pseudo-SRAM with ECC based auto-adjusted self-refresh scheme","author":"pyo","year":"2009","journal-title":"Proc IEEE ISCAS"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2007.19"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2005.229"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2011.2166590"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1002\/j.1538-7305.1950.tb00463.x"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2007.903288"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/1543136.1542459"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/1403375.1403484"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2010.5456960"},{"key":"ref7","first-page":"132","article-title":"Managing multi-core soft-error reliability through utility-driven cross domain optimization","author":"zhang","year":"2008","journal-title":"Proc Int Conf Appl -Specific Syst Arch Process"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1145\/321906.321910"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2012.6176661"},{"key":"ref46","author":"duranton","year":"2013","journal-title":"The HiPEAC Vision for Advanced Computing in Horizon 2020"},{"key":"ref45","year":"2010","journal-title":"The Benefits of Multiple CPU Cores in Mobile Devices"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4757-3530-7"},{"key":"ref47","year":"2010","journal-title":"The SCC Programmer's Guide-Revision 0 75"},{"key":"ref42","year":"2013","journal-title":"Device Reliability Report"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2005.853449"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/ICASSP.1989.266596"},{"key":"ref43","article-title":"Trends from ten years of soft error experimentation","author":"dixit","year":"2009","journal-title":"Proc IEEE SELSE Workshop"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/92\/7046457\/06784042.pdf?arnumber=6784042","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:41:01Z","timestamp":1642005661000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/6784042"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,3]]},"references-count":50,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2014.2309663","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"value":"1063-8210","type":"print"},{"value":"1557-9999","type":"electronic"}],"subject":[],"published":{"date-parts":[[2015,3]]}}}