{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,29]],"date-time":"2025-09-29T11:47:06Z","timestamp":1759146426434,"version":"3.37.3"},"reference-count":30,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2015,3,1]],"date-time":"2015-03-01T00:00:00Z","timestamp":1425168000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61076018","61274030","61376043","61204047"],"award-info":[{"award-number":["61076018","61274030","61376043","61204047"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"National Basic Research Program of China (973)","award":["2011CB302503"],"award-info":[{"award-number":["2011CB302503"]}]},{"name":"Cooperative Project through Mentor Graphics"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2015,3]]},"DOI":"10.1109\/tvlsi.2014.2313563","type":"journal-article","created":{"date-parts":[[2014,4,16]],"date-time":"2014-04-16T14:02:48Z","timestamp":1397656968000},"page":"466-479","source":"Crossref","is-referenced-by-count":15,"title":["Diagnosis and Layout Aware (DLA) Scan Chain Stitching"],"prefix":"10.1109","volume":"23","author":[{"given":"Jing","family":"Ye","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yu","family":"Huang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yu","family":"Hu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wu-Tung","family":"Cheng","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ruifeng","family":"Guo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Liyang","family":"Lai","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ting-Pu","family":"Tai","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xiaowei","family":"Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Weipin","family":"Changchien","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Daw-Ming","family":"Lee","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ji-Jan","family":"Chen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sandeep C.","family":"Eruvathi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kartik K.","family":"Kumara","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Charles","family":"Liu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sam","family":"Pan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2013.6569355"},{"key":"ref10","first-page":"1","article-title":"Diagnosis with limited failure information","author":"huang","year":"2006","journal-title":"Proc ITC"},{"key":"ref11","first-page":"1","article-title":"Jump simulation: A technique for fast and precise scan-chain fault diagnosis","author":"kao","year":"2006","journal-title":"Proc ITC"},{"key":"ref12","doi-asserted-by":"crossref","first-page":"1861","DOI":"10.1109\/TCAD.2005.858267","article-title":"An algorithmic technique for diagnosis of faulty scan chains","volume":"25","author":"guo","year":"2006","journal-title":"IEEE Trans Comput -Aided Des Integr Circuits Syst"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2007.43"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2007.364644"},{"key":"ref15","first-page":"1","article-title":"Diagnose compound scan chain and system logic defects","author":"huang","year":"2007","journal-title":"Proc ITC"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2008.61"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2008.52"},{"key":"ref18","first-page":"1","article-title":"Deterministic diagnostic pattern generation (DDPG) for compound defects","author":"wang","year":"2008","journal-title":"Proc ITC"},{"key":"ref19","first-page":"1","article-title":"Detection and diagnosis of static scan cell internal defect","author":"guo","year":"2008","journal-title":"Proc ITC"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.1998.732169"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2008.83"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639683"},{"key":"ref3","first-page":"157","article-title":"Quick scan chain diagnosis using signal profiling","author":"yang","year":"2005","journal-title":"Proc ICCD"},{"key":"ref6","first-page":"44","article-title":"Efficient diagnosis for multiple intermittent scan chain hold-time faults","author":"huang","year":"2003","journal-title":"Proc ATS"},{"key":"ref29","first-page":"571","article-title":"A design-for-diagnosis technique for diagnosing combinational circuit faults with faulty scan chains","author":"wang","year":"2008","journal-title":"Proc ASPDAC"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/54.970425"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/1120725.1120934"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2004.1269035"},{"key":"ref2","first-page":"268","article-title":"A technique for fault diagnosis of defects in scan chains","author":"guo","year":"2001","journal-title":"Proc ITC"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1993.313363"},{"key":"ref9","first-page":"751","article-title":"Compressed pattern diagnosis for scan chain failures","author":"huang","year":"2005","journal-title":"Proc ITC"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2008.923258"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2009.36"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2009.74"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1992.232749"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2010.52"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.1995.523792"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1995.512645"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/92\/7046457\/06799296.pdf?arnumber=6799296","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T11:41:01Z","timestamp":1641987661000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/6799296"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,3]]},"references-count":30,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2014.2313563","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"type":"print","value":"1063-8210"},{"type":"electronic","value":"1557-9999"}],"subject":[],"published":{"date-parts":[[2015,3]]}}}