{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,10,9]],"date-time":"2026-10-09T15:51:56Z","timestamp":1791561116494,"version":"4.3.4"},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2015,4,1]],"date-time":"2015-04-01T00:00:00Z","timestamp":1427846400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2015,4,1]],"date-time":"2015-04-01T00:00:00Z","timestamp":1427846400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2015,4,1]],"date-time":"2015-04-01T00:00:00Z","timestamp":1427846400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"},{"start":{"date-parts":[[2015,4,1]],"date-time":"2015-04-01T00:00:00Z","timestamp":1427846400000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/tdmrep.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2015,4]]},"DOI":"10.1109\/tvlsi.2014.2320307","type":"journal-article","created":{"date-parts":[[2014,5,13]],"date-time":"2014-05-13T14:14:00Z","timestamp":1399990440000},"page":"743-751","source":"Crossref","is-referenced-by-count":32,"title":["Impact of Bias Temperature Instability on Soft Error Susceptibility"],"prefix":"10.1109","volume":"23","author":[{"given":"Daniele","family":"Rossi","sequence":"first","affiliation":[{"name":"University of Bologna","place":["Bologna, Italy"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Martin","family":"Oma\u00f1a","sequence":"additional","affiliation":[{"name":"University of Bologna","place":["Bologna, Italy"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Cecilia","family":"Metra","sequence":"additional","affiliation":[{"name":"University of Bologna","place":["Bologna, Italy"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Alessandro","family":"Paccagnella","sequence":"additional","affiliation":[{"name":"University of Padova","place":["Padova, Italy"]}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref31","year":"0","journal-title":"ITC99 Benchmark Home Page"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1023\/B:JETT.0000042514.37566.6d"},{"key":"ref10","first-page":"40","article-title":"Hole trapping effect on methodology for DC and AC negative bias temperature instability measurements in pMOS transistors","author":"huard","year":"2004","journal-title":"Proc 42nd Annu IEEE Int Rel Phys Symp"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2008.4700619"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2004.03.019"},{"key":"ref13","first-page":"735","article-title":"An efficient method to identify critical gates under circuit aging","author":"wang","year":"2007","journal-title":"Proc IEEE\/ACM ICCAD"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2012.6219086"},{"key":"ref15","first-page":"1","article-title":"Self-checking monitor for NBTI due degradation","author":"oma\u00f1a","year":"2010","journal-title":"Proc IEEE 16th IMS3TW"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2011.246"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2010.2084100"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2007.912983"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2007.168"},{"key":"ref28","author":"weste","year":"2004","journal-title":"CMOS VLSI Design A Circuits and Systems Perspective"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2010.53"},{"key":"ref27","year":"2007","journal-title":"PTM"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2005.853449"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2009.2020391"},{"key":"ref29","author":"rabaey","year":"2003","journal-title":"Digital Integrated Circuits"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2010.24"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.853696"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2005.49"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2007.369907"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2009.2017751"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ICICDT.2007.4299573"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2011.45"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2011.5770755"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2012.2232680"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.1982.4336490"},{"key":"ref23","first-page":"152","article-title":"From mean values to distribution of BTI lifetime of deeply scaled FETs through atomistic understanding of the degradation","author":"toledano-luque","year":"2011","journal-title":"Symp on VLSI Technol Dig of Tech Paper"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/23.903813"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.1993.393319"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/92\/7063292\/06814927.pdf?arnumber=6814927","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,10,9]],"date-time":"2026-10-09T15:11:54Z","timestamp":1791558714000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/6814927\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,4]]},"references-count":31,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2014.2320307","relation":{},"ISSN":["1557-9999","1063-8210"],"issn-type":[{"value":"1557-9999","type":"electronic"},{"value":"1063-8210","type":"print"}],"subject":[],"published":{"date-parts":[[2015,4]]}}}