{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,10,19]],"date-time":"2023-10-19T23:07:33Z","timestamp":1697756853656},"reference-count":24,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2015,6,1]],"date-time":"2015-06-01T00:00:00Z","timestamp":1433116800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2015,6]]},"DOI":"10.1109\/tvlsi.2014.2326081","type":"journal-article","created":{"date-parts":[[2014,6,19]],"date-time":"2014-06-19T20:13:44Z","timestamp":1403208824000},"page":"1175-1179","source":"Crossref","is-referenced-by-count":4,"title":["Demystifying Iddq Data With Process Variation for Automatic Chip Classification"],"prefix":"10.1109","volume":"23","author":[{"given":"Chia-Ling Lynn","family":"Chang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Charles H.-P.","family":"Wen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2009.2029113"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1996.510876"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894206"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2005.863183"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/1230800.1230804"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2005.863747"},{"key":"ref16","year":"2014","journal-title":"FreePDK45"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/66.999598"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1145\/1391469.1391624"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2000.839819"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2000.843876"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805801"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966621"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805803"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.2002.1173535"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1386966"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1996.510844"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/989995.989997"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ICVD.2003.1183162"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1999.766656"},{"key":"ref22","year":"2014","journal-title":"IWLS 2005 Benchmarks"},{"key":"ref21","first-page":"163","article-title":"An intelligent analysis of Iddq data for chip classification in very deep-submicron (VDSM) CMOS technology","author":"chang","year":"2012","journal-title":"Proc 17th ASPDAC"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1111\/1467-9868.00293"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2011.6139175"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/92\/7110706\/06837510.pdf?arnumber=6837510","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:06:03Z","timestamp":1642003563000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/6837510"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,6]]},"references-count":24,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2014.2326081","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"value":"1063-8210","type":"print"},{"value":"1557-9999","type":"electronic"}],"subject":[],"published":{"date-parts":[[2015,6]]}}}