{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,12,31]],"date-time":"2022-12-31T07:10:04Z","timestamp":1672470604228},"reference-count":8,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2015,6,1]],"date-time":"2015-06-01T00:00:00Z","timestamp":1433116800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2015,6]]},"DOI":"10.1109\/tvlsi.2014.2332099","type":"journal-article","created":{"date-parts":[[2014,10,6]],"date-time":"2014-10-06T15:08:34Z","timestamp":1412608114000},"page":"1165-1169","source":"Crossref","is-referenced-by-count":3,"title":["True-Damage-Aware Enumerative Coding for Improving <sc>nand<\/sc> Flash Memory Endurance"],"prefix":"10.1109","volume":"23","author":[{"given":"Jiangpeng","family":"Li","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kai","family":"Zhao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jun","family":"Ma","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tong","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/2463209.2488936"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2011.2174389"},{"key":"ref6","first-page":"521","article-title":"Error patterns in MLC NAND flash memory: Measurement characterization, and analysis","author":"cai","year":"2012","journal-title":"Proc Design Autom Test Eur"},{"key":"ref5","article-title":"CAFTL: A content-aware flash translation layer enhancing the lifespan of flash memory based solid state drives","author":"chen","year":"2011","journal-title":"Proc USENIX Conf File and Storage Technologies (FAST)"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.1973.1054929"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/GLOCOMW.2010.5700260"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2011.2157183"},{"key":"ref1","first-page":"424","article-title":"Over-10x-extended-lifetime 76%-reduced solid-state drives (SSDs) with error-prediction LDPC architecture and error-recovery scheme","author":"tanakamaru","year":"2012","journal-title":"Proc IEEE Int Solid-State Circuits Conf"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/92\/7110706\/06850058.pdf?arnumber=6850058","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:06:03Z","timestamp":1642003563000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/6850058"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,6]]},"references-count":8,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2014.2332099","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"value":"1063-8210","type":"print"},{"value":"1557-9999","type":"electronic"}],"subject":[],"published":{"date-parts":[[2015,6]]}}}