{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,9]],"date-time":"2026-03-09T10:23:54Z","timestamp":1773051834086,"version":"3.50.1"},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[2015,9,1]],"date-time":"2015-09-01T00:00:00Z","timestamp":1441065600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2015,9]]},"DOI":"10.1109\/tvlsi.2014.2348872","type":"journal-article","created":{"date-parts":[[2014,9,8]],"date-time":"2014-09-08T20:58:07Z","timestamp":1410209887000},"page":"1628-1639","source":"Crossref","is-referenced-by-count":14,"title":["Soft-Error-Tolerant Design Methodology for Balancing Performance, Power, and Reliability"],"prefix":"10.1109","volume":"23","author":[{"given":"Hsuan-Ming","family":"Chou","sequence":"first","affiliation":[]},{"given":"Ming-Yi","family":"Hsiao","sequence":"additional","affiliation":[]},{"given":"Yi-Chiao","family":"Chen","sequence":"additional","affiliation":[]},{"given":"Keng-Hao","family":"Yang","sequence":"additional","affiliation":[]},{"given":"Jean","family":"Tsao","sequence":"additional","affiliation":[]},{"given":"Chiao-Ling","family":"Lung","sequence":"additional","affiliation":[]},{"given":"Shih-Chieh","family":"Chang","sequence":"additional","affiliation":[]},{"given":"Wen-Ben","family":"Jone","sequence":"additional","affiliation":[]},{"given":"Tien-Fu","family":"Chen","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.853696"},{"key":"ref30","first-page":"754","article-title":"FASER: Fast analysis of soft error susceptibility for cell-based designs","author":"zhang","year":"2006","journal-title":"Proc Int Symp Quality Electronic Design (ISQED)"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2011.5770787"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ISCA.2008.9"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1147\/rd.62.0200"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/12.2145"},{"key":"ref14","first-page":"33","article-title":"A new physical mechanism for soft errors in dynamic memories","author":"may","year":"1978","journal-title":"Proc Rel Phys Symp"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1147104"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297681"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2003.816568"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2003.1253181"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ISCA.2012.6237024"},{"key":"ref28","first-page":"1","article-title":"Understanding soft error propagation using efficient vulnerability-driven fault injection","author":"xu","year":"2012","journal-title":"Proc IEEE\/IFIP Int Conf Dependable Syst Netw (DSN)"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.2514\/6.1989-3126"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1145\/1629911.1630042"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2003.1253179"},{"key":"ref6","first-page":"1656","article-title":"Low power 32-bit UniRISC with power block manager","author":"hsiao","year":"2008","journal-title":"Proc IEEE Asia Pacific Conf Circuits Syst"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.862738"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1147\/rd.523.0225"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TDSC.2004.14"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.5121\/vlsic.2012.3403"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2009.5270340"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISLPED.2011.5993629"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2005.1465256"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1999.766651"},{"key":"ref22","article-title":"Algorithms for knapsack problems","author":"pisinger","year":"1995"},{"key":"ref21","year":"2014","journal-title":"NSCU EDA Wiki"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1145\/1250662.1250725"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2006.244060"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1145\/1250662.1250726"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1145\/1815961.1816023"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/92\/7217857\/06891393.pdf?arnumber=6891393","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:41:38Z","timestamp":1642005698000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/6891393"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,9]]},"references-count":31,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2014.2348872","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"value":"1063-8210","type":"print"},{"value":"1557-9999","type":"electronic"}],"subject":[],"published":{"date-parts":[[2015,9]]}}}