{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,4,4]],"date-time":"2022-04-04T08:47:37Z","timestamp":1649062057473},"reference-count":40,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2016,5,1]],"date-time":"2016-05-01T00:00:00Z","timestamp":1462060800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2016,5]]},"DOI":"10.1109\/tvlsi.2015.2480378","type":"journal-article","created":{"date-parts":[[2015,10,16]],"date-time":"2015-10-16T18:56:15Z","timestamp":1445021775000},"page":"1794-1807","source":"Crossref","is-referenced-by-count":1,"title":["Area-Aware Cache Update Trackers for Postsilicon Validation"],"prefix":"10.1109","volume":"24","author":[{"given":"Sandeep","family":"Chandran","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Smruti R.","family":"Sarangi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Preeti Ranjan","family":"Panda","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1145\/1275571.1275600"},{"key":"ref38","first-page":"249","article-title":"Efficient on-line algorithm for maintaining k-cover of sparse bit-strings","author":"kumar","year":"2012","journal-title":"Proc IARCS Annu Conf Found Softw Technol Theoretical Comput Sci (FSTTCS)"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.ipl.2010.05.018"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2013.112"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2011.2166416"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1145\/1837274.1837466"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1145\/1629911.1630007"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1145\/233269.233324"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1145\/253168.253190"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1145\/1739041.1739071"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2010.123"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/PATMOS.2015.7347586"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2008.4484858"},{"key":"ref12","first-page":"1338","article-title":"Trace signal selection for visibility enhancement in post-silicon validation","author":"liu","year":"2009","journal-title":"Proc Design Autom Test Eur Conf Exhibition (DATE)"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2010.5419883"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2010.5654123"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2013.206"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2006.238683"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2009.5090658"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2008.4484892"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2008.15"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ISPASS.2009.4919650"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2011.6105414"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2013.202"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2010.5699215"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2010.5699214"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2011.5783748"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/1837274.1837367"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2007.4437613"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2011.6105391"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2012.6164963"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2010.122"},{"key":"ref1","first-page":"91","article-title":"Automating post-silicon debugging and repair","author":"chang","year":"2007","journal-title":"Proc IEEE\/ACM Int Conf Comput -Aided Design (ICCAD)"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2013.107"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1145\/2024724.2024855"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2011.5770738"},{"key":"ref24","doi-asserted-by":"crossref","first-page":"373","DOI":"10.1145\/1391469.1391569","article-title":"ifra: instruction footprint recording and analysis for post-silicon bug localization in processors","author":"sung-boem park","year":"2008","journal-title":"2008 45th ACM\/IEEE Design Automation Conference DAC"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2009.4798278"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2004.1382669"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2009.2038390"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/92\/7456352\/7299692.pdf?arnumber=7299692","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:44:47Z","timestamp":1642005887000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7299692\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,5]]},"references-count":40,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2015.2480378","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"value":"1063-8210","type":"print"},{"value":"1557-9999","type":"electronic"}],"subject":[],"published":{"date-parts":[[2016,5]]}}}