{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,16]],"date-time":"2026-03-16T15:26:29Z","timestamp":1773674789096,"version":"3.50.1"},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2016,5,1]],"date-time":"2016-05-01T00:00:00Z","timestamp":1462060800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2016,5,1]],"date-time":"2016-05-01T00:00:00Z","timestamp":1462060800000},"content-version":"am","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2016,5,1]],"date-time":"2016-05-01T00:00:00Z","timestamp":1462060800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2016,5,1]],"date-time":"2016-05-01T00:00:00Z","timestamp":1462060800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Science Foundation of China","doi-asserted-by":"publisher","award":["61504007"],"award-info":[{"award-number":["61504007"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Science Foundation of China","doi-asserted-by":"publisher","award":["61221061"],"award-info":[{"award-number":["61221061"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Science Foundation of China","doi-asserted-by":"publisher","award":["61427803"],"award-info":[{"award-number":["61427803"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100000028","name":"National Science Foundation and Semiconductor Research Corporation","doi-asserted-by":"publisher","award":["NSF\/SRC FRS: CCF-1255898"],"award-info":[{"award-number":["NSF\/SRC FRS: CCF-1255898"]}],"id":[{"id":"10.13039\/100000028","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2016,5]]},"DOI":"10.1109\/tvlsi.2015.2492000","type":"journal-article","created":{"date-parts":[[2015,11,25]],"date-time":"2015-11-25T19:06:51Z","timestamp":1448478411000},"page":"1715-1727","source":"Crossref","is-referenced-by-count":15,"title":["A Novel Peak Power Supply Noise Measurement and Adaptation System for Integrated Circuits"],"prefix":"10.1109","volume":"24","author":[{"given":"Xiaoxiao","family":"Wang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dongrong","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Donglin","family":"Su","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Leroy","family":"Winemberg","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mark","family":"Tehranipoor","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2013.14"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2012.6401593"},{"key":"ref10","first-page":"219","article-title":"Evaluation of power supply noise reduction by implementing on-chip capacitance","author":"fujii","year":"2011","journal-title":"Proc 8th Workshop Electromagn Compat Integr Circuits (EMC Compo)"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/4.658628"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2007.35"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2007.373409"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2011.33"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2014.12"},{"key":"ref16","first-page":"368","article-title":"Voltage noise in multi-core processors: Empirical characterization and optimization opportunities","author":"bertran","year":"2007","journal-title":"Proc 47th Annu IEEE\/ACM Int Symp Microarchit (MICRO)"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/92.365453"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2012.2228741"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/PrimeAsia.2012.6458631"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2007.893578"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2008.4700707"},{"key":"ref27","author":"sedra","year":"1991","journal-title":"Microelectronic Circuits"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2007.4437591"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2004.842853"},{"key":"ref29","year":"2015","journal-title":"45nm Nangate Technology Node"},{"key":"ref5","article-title":"Resolution programmable dynamic IR-drop sensor with peak IR-drop tracking abilities","author":"wang","year":"2013"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/APCCAS.2008.4746113"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ASQED.2010.5548160"},{"key":"ref2","first-page":"1","article-title":"On-chip EMI monitoring for integrated circuits of 55 nm and below technologies","author":"wang","year":"2014","journal-title":"Proc 31st URSI General Assembly Sci Symp (URSI GASS)"},{"key":"ref9","first-page":"1","article-title":"Worst-case IR-drop monitoring with 1 GHz sampling rate","author":"hsu","year":"2013","journal-title":"Proc Int Symp VLSI Design Autom Test (VLSI-DAT)"},{"key":"ref1","year":"2015","journal-title":"40 nm Technology"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1145\/2463209.2488735"},{"key":"ref22","first-page":"106","article-title":"Adaptive clocking system for improved power efficiency in a 28 nm x86-64 microprocessor","author":"grenat","year":"2014","journal-title":"Proc IEEE Int Solid-State Circuits Conf (ISSCC)"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1145\/1391469.1391606"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1145\/2463209.2488754"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2013.342"},{"key":"ref26","author":"rabaey","year":"2003","journal-title":"Digital Integrated Circuits A Design Perspective"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2014.2366876"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/ieeexplore.ieee.org\/ielaam\/92\/7456352\/7337452-aam.pdf","content-type":"application\/pdf","content-version":"am","intended-application":"syndication"},{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/92\/7456352\/07337452.pdf?arnumber=7337452","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,8]],"date-time":"2022-04-08T18:48:34Z","timestamp":1649443714000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7337452\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,5]]},"references-count":31,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2015.2492000","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"value":"1063-8210","type":"print"},{"value":"1557-9999","type":"electronic"}],"subject":[],"published":{"date-parts":[[2016,5]]}}}