{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,26]],"date-time":"2026-02-26T15:50:34Z","timestamp":1772121034472,"version":"3.50.1"},"reference-count":24,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[2016,8,1]],"date-time":"2016-08-01T00:00:00Z","timestamp":1470009600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"name":"National High-Tech Research and Development Program, China","award":["2011AA010405"],"award-info":[{"award-number":["2011AA010405"]}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61274028"],"award-info":[{"award-number":["61274028"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2016,8]]},"DOI":"10.1109\/tvlsi.2016.2535224","type":"journal-article","created":{"date-parts":[[2016,4,1]],"date-time":"2016-04-01T14:18:32Z","timestamp":1459520312000},"page":"2654-2664","source":"Crossref","is-referenced-by-count":35,"title":["Exploiting Intracell Bit-Error Characteristics to Improve Min-Sum LDPC Decoding for MLC NAND Flash-Based Storage in Mobile Device"],"prefix":"10.1109","volume":"24","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2153-2906","authenticated-orcid":false,"given":"Hongbin","family":"Sun","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wenzhe","family":"Zhao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Minjie","family":"Lv","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Guiqiang","family":"Dong","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Nanning","family":"Zheng","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tong","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2005.844113"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2011.5937930"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2012.2222399"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/DSD.2005.77"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/SOCCON.2009.5398044"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/MCAS.2010.939785"},{"key":"ref16","first-page":"1856","article-title":"Error characterization and coding schemes for flash memories","author":"yaakobi","year":"2013","journal-title":"Proc IEEE GLOBECOM Workshops"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2015.7062965"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/MSST.2014.6855550"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2010.5488762"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2007.4418892"},{"key":"ref3","first-page":"2","article-title":"The bleak future of NAND flash memory","author":"grupp","year":"2012","journal-title":"Proc USENIX Conf File Storage Technol (FAST)"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/18.748992"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/VTSA.2008.4530774"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2011.6026357"},{"key":"ref7","article-title":"Error correcting techniques for future NAND flash memory in SSD applications","author":"duann","year":"2009","journal-title":"FlashMemory Summit"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2012.54"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2014.2345387"},{"key":"ref9","first-page":"243","article-title":"LDPC-in-SSD: Making advanced error correction codes work effectively in solid state drives","author":"zhao","year":"2013","journal-title":"Proc USENIX Conf File Storage Technol (FAST)"},{"key":"ref20","year":"0","journal-title":"DiskMon"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JSAC.2009.090816"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2010.2071990"},{"key":"ref24","year":"2013","journal-title":"NAND Flash Memory Datasheet"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2007.906890"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/92\/7519042\/07445886.pdf?arnumber=7445886","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T11:43:31Z","timestamp":1641987811000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7445886\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,8]]},"references-count":24,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2016.2535224","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"value":"1063-8210","type":"print"},{"value":"1557-9999","type":"electronic"}],"subject":[],"published":{"date-parts":[[2016,8]]}}}