{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,27]],"date-time":"2026-01-27T10:37:16Z","timestamp":1769510236904,"version":"3.49.0"},"reference-count":35,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2017,3,1]],"date-time":"2017-03-01T00:00:00Z","timestamp":1488326400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2017,3,1]],"date-time":"2017-03-01T00:00:00Z","timestamp":1488326400000},"content-version":"am","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2017,3,1]],"date-time":"2017-03-01T00:00:00Z","timestamp":1488326400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2017,3,1]],"date-time":"2017-03-01T00:00:00Z","timestamp":1488326400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012165","name":"Key Technologies R&D Program","doi-asserted-by":"crossref","award":["2016YFB0201304"],"award-info":[{"award-number":["2016YFB0201304"]}],"id":[{"id":"10.13039\/501100012165","id-type":"DOI","asserted-by":"crossref"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61274032"],"award-info":[{"award-number":["61274032"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61376040"],"award-info":[{"award-number":["61376040"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61574044"],"award-info":[{"award-number":["61574044"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61574046"],"award-info":[{"award-number":["61574046"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Recruitment Program of Global Experts (the Thousand Talents Plan)"},{"DOI":"10.13039\/100000001","name":"National Science Foundation","doi-asserted-by":"publisher","award":["CCF-1148778"],"award-info":[{"award-number":["CCF-1148778"]}],"id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2017,3]]},"DOI":"10.1109\/tvlsi.2016.2601606","type":"journal-article","created":{"date-parts":[[2016,9,12]],"date-time":"2016-09-12T18:08:00Z","timestamp":1473703680000},"page":"806-819","source":"Crossref","is-referenced-by-count":35,"title":["High-Dimensional and Multiple-Failure-Region Importance Sampling for SRAM Yield Analysis"],"prefix":"10.1109","volume":"25","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-7128-4352","authenticated-orcid":false,"given":"Mengshuo","family":"Wang","sequence":"first","affiliation":[]},{"given":"Changhao","family":"Yan","sequence":"additional","affiliation":[]},{"given":"Xin","family":"Li","sequence":"additional","affiliation":[]},{"given":"Dian","family":"Zhou","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8097-4053","authenticated-orcid":false,"given":"Xuan","family":"Zeng","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1145\/2429384.2429420"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2007.364490"},{"key":"ref31","author":"surhone","year":"2010","journal-title":"Radial Basis Function Network"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/72.97934"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.859030"},{"key":"ref34","first-page":"1","article-title":"Enabling efficient analog synthesis by coupling sparse regression and polynomial optimization","author":"wang","year":"2014","journal-title":"Proc 51st ACM\/EDAC\/IEEE Design Autom Conf (DAC)"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2007.4405720"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2013.6691160"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2014.7001370"},{"key":"ref13","first-page":"1","article-title":"Parametric yield estimation for SRAM cells: Concepts, algorithms and challenges","author":"gong","year":"2010","journal-title":"Proc ACM\/IEEE Design Autom Conf (DAC)"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2013768"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2009.2016633"},{"key":"ref16","author":"fishman","year":"2006","journal-title":"A First Course in Monte Carlo"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2012.2226504"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2014.2377013"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1007\/BF02591684"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.1969.10490666"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2008.4681593"},{"key":"ref27","doi-asserted-by":"crossref","first-page":"83","DOI":"10.1007\/BF02985802","article-title":"The elements of statistical learning: Data mining, inference and prediction","volume":"27","author":"hastie","year":"2005","journal-title":"Math Intell"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1146930"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/2024724.2024769"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1142\/5915"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2010.5456940"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/1837274.1837372"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2013.2292504"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2007.09.001"},{"key":"ref9","first-page":"754","article-title":"An efficient, fully nonlinear, variability-aware non-Monte-Carlo yield estimation procedure with applications to SRAM cells and ring oscillators","author":"gu","year":"2008","journal-title":"Proc Asia South Pacific Design Autom Conf"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/9780470544365"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1007\/s10589-005-4615-1"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/S0378-4754(98)00096-2"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/0041-5553(67)90144-9"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.2307\/2346830"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2010.2062750"},{"key":"ref26","author":"radoslav","year":"2008","journal-title":"Sequential Quadratic Programming"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1017\/S0962492900002518"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/ieeexplore.ieee.org\/ielaam\/92\/7862316\/7564452-aam.pdf","content-type":"application\/pdf","content-version":"am","intended-application":"syndication"},{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/92\/7862316\/07564452.pdf?arnumber=7564452","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,8]],"date-time":"2022-04-08T18:48:33Z","timestamp":1649443713000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7564452\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,3]]},"references-count":35,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2016.2601606","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"value":"1063-8210","type":"print"},{"value":"1557-9999","type":"electronic"}],"subject":[],"published":{"date-parts":[[2017,3]]}}}