{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,30]],"date-time":"2026-04-30T17:33:13Z","timestamp":1777570393672,"version":"3.51.4"},"reference-count":64,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2017,3,1]],"date-time":"2017-03-01T00:00:00Z","timestamp":1488326400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Science Foundation of China","doi-asserted-by":"publisher","award":["61170063"],"award-info":[{"award-number":["61170063"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Science Foundation of China","doi-asserted-by":"publisher","award":["61373021"],"award-info":[{"award-number":["61373021"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003711","name":"Research Project from the Ministry of Science and Technology","doi-asserted-by":"publisher","award":["2016YFB1000200"],"award-info":[{"award-number":["2016YFB1000200"]}],"id":[{"id":"10.13039\/501100003711","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001691","name":"JSPS Grant-in-Aid for Scientific Research (B)","doi-asserted-by":"publisher","award":["25280016"],"award-info":[{"award-number":["25280016"]}],"id":[{"id":"10.13039\/501100001691","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001691","name":"JSPS Grant-in-Aid for Scientific Research on Innovative Area","doi-asserted-by":"publisher","award":["15k12003"],"award-info":[{"award-number":["15k12003"]}],"id":[{"id":"10.13039\/501100001691","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001691","name":"JSPS Grant-in-Aid for the Promotions of Bilateral Joint Research Projects (Japan-Germany)","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001691","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2017,3]]},"DOI":"10.1109\/tvlsi.2016.2606248","type":"journal-article","created":{"date-parts":[[2016,9,19]],"date-time":"2016-09-19T19:15:26Z","timestamp":1474312526000},"page":"942-953","source":"Crossref","is-referenced-by-count":63,"title":["Low-Power Scan-Based Built-In Self-Test Based on Weighted Pseudorandom Test Pattern Generation and Reseeding"],"prefix":"10.1109","volume":"25","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-4788-511X","authenticated-orcid":false,"given":"Dong","family":"Xiang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xiaoqing","family":"Wen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Laung-Terng","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1145\/2790297"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1145\/2778953"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2010.67"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2001.966712"},{"key":"ref31","doi-asserted-by":"crossref","first-page":"1048","DOI":"10.1109\/43.536711","article-title":"HOPE: An efficient parallel fault simulator for synchronous sequential circuits","volume":"15","author":"lee","year":"1996","journal-title":"IEEE Trans Comput -Aided Design Integr Circuits Syst"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2006.882509"},{"key":"ref37","doi-asserted-by":"crossref","first-page":"1050","DOI":"10.1109\/43.238041","article-title":"3-weight pseudo-random test generation based on a deterministic test set for combinational and sequential circuits","volume":"12","author":"pomeranz","year":"1993","journal-title":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"},{"key":"ref36","first-page":"1","article-title":"Novel approach to reduce power droop during scan-based logic BIST","author":"oma\u00f1a","year":"2013","journal-title":"Proc IEEE Eur Test Symp"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2007.70794"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2004.831593"},{"key":"ref60","doi-asserted-by":"publisher","DOI":"10.1145\/2491477.2491488"},{"key":"ref62","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2440323"},{"key":"ref61","doi-asserted-by":"publisher","DOI":"10.1587\/transele.E92.C.444"},{"key":"ref63","doi-asserted-by":"publisher","DOI":"10.1109\/43.892863"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2006.870861"},{"key":"ref64","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1993.313316"},{"key":"ref27","first-page":"237","article-title":"LFSR-coded test patterns for scan designs","author":"koenemann","year":"1991","journal-title":"Proc Eur Test Conf"},{"key":"ref29","first-page":"57","article-title":"Logic BIST with scan chain segmentation","author":"lai","year":"2006","journal-title":"Proc IEEE Int Test Conf"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/54.199807"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2015736"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2000.896514"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/SOCC.2015.7406961"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2004.837985"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/43.511581"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2015.9"},{"key":"ref26","doi-asserted-by":"crossref","first-page":"913","DOI":"10.1109\/TCAD.2005.855977","article-title":"Increasing encoding efficiency of LFSR reseeding-based test compression","volume":"25","author":"kim","year":"2006","journal-title":"IEEE Transactions on Computer-Aided Design of Integrated"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1023\/A:1008353423305"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1109\/43.856978"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2014.6783399"},{"key":"ref59","doi-asserted-by":"publisher","DOI":"10.1145\/2159542.2159550"},{"key":"ref58","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2018775"},{"key":"ref57","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2008.923260"},{"key":"ref56","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2007.70767"},{"key":"ref55","first-page":"265","article-title":"On low-capture-power test generation for scan testing","author":"wen","year":"2005","journal-title":"Proc VLSI Test Symp"},{"key":"ref54","first-page":"1018","article-title":"Low-capture-power test generation for scan-based at-speed testing","author":"wen","year":"2005","journal-title":"Proc Int Test Conf"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1145\/2757278"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1147\/rd.332.0149"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2014.2332465"},{"key":"ref11","first-page":"705","article-title":"Applications of testability analysis: From ATPG to critical path tracing","author":"brglez","year":"1984","journal-title":"Proc IEEE Int Test Conf"},{"key":"ref40","year":"2015","journal-title":"Primitive Polynomial Generation Tool"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2009.15"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2010.5469590"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2010.5654124"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1023\/A:1008383013319"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2002.1033791"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894260"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/12.364534"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894274"},{"key":"ref4","year":"2015","journal-title":"Astro Advanced Place-and-Route Solution for SoC Design"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2006.884582"},{"key":"ref6","author":"bardell","year":"1987","journal-title":"Built in Test for VLSI Pseudorandom Techniques"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2007.895840"},{"key":"ref8","author":"bushnell","year":"2000","journal-title":"Essentials of Electronic Testing"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1023\/A:1027470721780"},{"key":"ref49","first-page":"19","article-title":"Low power BIST for scan-shift and capture power","author":"sato","year":"2013","journal-title":"Proc Asian Test Symp"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2003.1252851"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2012.6401559"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2015.7085417"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1145\/2637481"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2014.2338862"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2004.826558"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743303"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/12.817399"},{"key":"ref43","first-page":"173","article-title":"Low power BIST for scan-shift and capture power","author":"wang","year":"2012","journal-title":"Proc IEEE Asian Test Symp"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/92\/7862316\/07571138.pdf?arnumber=7571138","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:12:04Z","timestamp":1642003924000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7571138\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,3]]},"references-count":64,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2016.2606248","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"value":"1063-8210","type":"print"},{"value":"1557-9999","type":"electronic"}],"subject":[],"published":{"date-parts":[[2017,3]]}}}