{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T10:21:42Z","timestamp":1740133302667,"version":"3.37.3"},"reference-count":20,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2017,4,1]],"date-time":"2017-04-01T00:00:00Z","timestamp":1491004800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2017,4]]},"DOI":"10.1109\/tvlsi.2016.2638021","type":"journal-article","created":{"date-parts":[[2017,1,4]],"date-time":"2017-01-04T19:12:35Z","timestamp":1483557155000},"page":"1455-1466","source":"Crossref","is-referenced-by-count":4,"title":["Scalable Device Array for Statistical Characterization of BTI-Related Parameters"],"prefix":"10.1109","volume":"25","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-3674-4584","authenticated-orcid":false,"given":"Hiromitsu","family":"Awano","sequence":"first","affiliation":[]},{"given":"Shumpei","family":"Morita","sequence":"additional","affiliation":[]},{"given":"Takashi","family":"Sato","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.917502"},{"key":"ref11","first-page":"448","article-title":"Analysis of NBTI degradation-and recovery-behavior based on ultra fast VT-measurements","author":"reisinger","year":"2006","journal-title":"Proc Int Rel Phys Symp"},{"key":"ref12","first-page":"109","article-title":"On-the-fly characterization of NBTI in ultra-thin gate oxide PMOSFET’s","author":"denais","year":"2004","journal-title":"IEDM Tech Dig"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/S0026-2714(02)00027-6"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2007.911351"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2006.320885"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1038\/506150a"},{"key":"ref17","first-page":"26","article-title":"Origin of NBTI variability in deeply scaled pFETs","author":"kaczer","year":"2010","journal-title":"Proc IEEE Int Rel Phys Symp"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2013.6724636"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1989.572629"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2014.2327164"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ESSDERC.2011.6044214"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2012.6187510"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2014.2308140"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1063\/1.96325"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2011.2164543"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2005.845880"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2006.10.006"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/2024724.2024796"},{"key":"ref20","first-page":"150","article-title":"Suppression of \n$V_{\\mathrm{ T}}$\n variability degradation induced by NBTI with RDF control","author":"tsunomura","year":"2011","journal-title":"Symp VLSI Technol Dig Tech Papers"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/92\/7882729\/07805296.pdf?arnumber=7805296","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:13:10Z","timestamp":1642003990000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7805296\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,4]]},"references-count":20,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2016.2638021","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"type":"print","value":"1063-8210"},{"type":"electronic","value":"1557-9999"}],"subject":[],"published":{"date-parts":[[2017,4]]}}}