{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,31]],"date-time":"2026-03-31T14:08:53Z","timestamp":1774966133182,"version":"3.50.1"},"reference-count":12,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2017,4,1]],"date-time":"2017-04-01T00:00:00Z","timestamp":1491004800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2017,4]]},"DOI":"10.1109\/tvlsi.2016.2641259","type":"journal-article","created":{"date-parts":[[2017,1,9]],"date-time":"2017-01-09T21:41:29Z","timestamp":1483998089000},"page":"1563-1567","source":"Crossref","is-referenced-by-count":14,"title":["A Single Channel Split ADC Structure for Digital Background Calibration in Pipelined ADCs"],"prefix":"10.1109","volume":"25","author":[{"given":"Mohammad Ali","family":"Montazerolghaem","sequence":"first","affiliation":[]},{"given":"Tohid","family":"Moosazadeh","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2007-2979","authenticated-orcid":false,"given":"Mohammad","family":"Yavari","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2028756"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2300199"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2004.836842"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2010.2082850"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/s10470-013-0247-z"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2031044"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2002.1010664"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.923724"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2024809"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2012.2188461"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/82.554434"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2013.2252518"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/92\/7882729\/07809130.pdf?arnumber=7809130","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:13:10Z","timestamp":1642003990000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7809130\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,4]]},"references-count":12,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2016.2641259","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"value":"1063-8210","type":"print"},{"value":"1557-9999","type":"electronic"}],"subject":[],"published":{"date-parts":[[2017,4]]}}}