{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,15]],"date-time":"2026-01-15T00:15:10Z","timestamp":1768436110884,"version":"3.49.0"},"reference-count":25,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2017,5,1]],"date-time":"2017-05-01T00:00:00Z","timestamp":1493596800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2017,5,1]],"date-time":"2017-05-01T00:00:00Z","timestamp":1493596800000},"content-version":"am","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2017,5,1]],"date-time":"2017-05-01T00:00:00Z","timestamp":1493596800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2017,5,1]],"date-time":"2017-05-01T00:00:00Z","timestamp":1493596800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000006","name":"Office of Naval Research","doi-asserted-by":"publisher","award":["N00014-02-1-0883"],"award-info":[{"award-number":["N00014-02-1-0883"]}],"id":[{"id":"10.13039\/100000006","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100000006","name":"Office of Naval Research","doi-asserted-by":"publisher","award":["N00014-06-1-0016"],"award-info":[{"award-number":["N00014-06-1-0016"]}],"id":[{"id":"10.13039\/100000006","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100000001","name":"National Science Foundation Grant NER and Grant ECS","doi-asserted-by":"publisher","award":["0622068"],"award-info":[{"award-number":["0622068"]}],"id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Connecticut Innovation Grant"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2017,5]]},"DOI":"10.1109\/tvlsi.2016.2645795","type":"journal-article","created":{"date-parts":[[2017,1,17]],"date-time":"2017-01-17T03:16:51Z","timestamp":1484623011000},"page":"1774-1781","source":"Crossref","is-referenced-by-count":17,"title":["Floating Gate Nonvolatile Memory Using Individually Cladded Monodispersed Quantum Dots"],"prefix":"10.1109","volume":"25","author":[{"given":"Ravi Shankar R.","family":"Velampati","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"El-Sayed","family":"Hasaneen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"E. K.","family":"Heller","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3961-6665","authenticated-orcid":false,"given":"Faquir C.","family":"Jain","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1063\/1.368199"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.1995.499252"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1149\/1.1360210"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2012.2198248"},{"key":"ref14","first-page":"160","article-title":"A novel nonvolatile memory using SiOx -cladded Si quantum dots","author":"velampati","year":"2007","journal-title":"Proc NSTI Nanotechnol Conf"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/s11664-011-1685-y"},{"key":"ref16","article-title":"Site-specific nanoparticle self-assembly","author":"jain","year":"2008"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1021\/cm010362l"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1021\/cm9800579"},{"key":"ref19","author":"liu","year":"2001","journal-title":"MOSFET Models for Spice Simulation"},{"key":"ref4","doi-asserted-by":"crossref","first-page":"70","DOI":"10.1109\/IEDM.1967.187833","article-title":"the variable threshold transistor, a new electrically-alterable, non-destructive read-only storage device","author":"wegener","year":"1967","journal-title":"1967 International Electron Devices Meeting"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2015.2420954"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1002\/pssa.201300029"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2011.2169278"},{"key":"ref8","first-page":"111","article-title":"Room temperature single electron effects in Si quantum dot memory with oxide-nitride tunneling dielectrics","author":"kim","year":"1998","journal-title":"IEDM Tech Dig"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1063\/1.116085"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2015.2393299"},{"key":"ref1","first-page":"7","article-title":"Silicon scaling and its consequences for memory technology","author":"maes","year":"2003","journal-title":"Proc IEEE NVSMW"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/16.535349"},{"key":"ref20","article-title":"BSIM4v4.7 MOSFET Model","author":"chen","year":"2011"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1007\/s11664-009-0755-x"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2004.05.073"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1063\/1.1449535"},{"key":"ref23","author":"duke","year":"1969","journal-title":"Tunneling in Solids"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ISDRS.2007.4422254"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/ieeexplore.ieee.org\/ielaam\/92\/7909068\/7817902-aam.pdf","content-type":"application\/pdf","content-version":"am","intended-application":"syndication"},{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/92\/7909068\/07817902.pdf?arnumber=7817902","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,8]],"date-time":"2022-04-08T18:48:32Z","timestamp":1649443712000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7817902\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,5]]},"references-count":25,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2016.2645795","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"value":"1063-8210","type":"print"},{"value":"1557-9999","type":"electronic"}],"subject":[],"published":{"date-parts":[[2017,5]]}}}