{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,20]],"date-time":"2026-05-20T16:33:17Z","timestamp":1779294797799,"version":"3.51.4"},"reference-count":32,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"7","license":[{"start":{"date-parts":[[2017,7,1]],"date-time":"2017-07-01T00:00:00Z","timestamp":1498867200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2017,7,1]],"date-time":"2017-07-01T00:00:00Z","timestamp":1498867200000},"content-version":"am","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2017,7,1]],"date-time":"2017-07-01T00:00:00Z","timestamp":1498867200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2017,7,1]],"date-time":"2017-07-01T00:00:00Z","timestamp":1498867200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000001","name":"National Science Foundation","doi-asserted-by":"publisher","award":["CAREER-1253024"],"award-info":[{"award-number":["CAREER-1253024"]}],"id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100000001","name":"National Science Foundation","doi-asserted-by":"publisher","award":["CCF-1318826"],"award-info":[{"award-number":["CCF-1318826"]}],"id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100000001","name":"National Science Foundation","doi-asserted-by":"publisher","award":["CNS-1421022"],"award-info":[{"award-number":["CNS-1421022"]}],"id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100000001","name":"National Science Foundation","doi-asserted-by":"publisher","award":["CNS-1421068"],"award-info":[{"award-number":["CNS-1421068"]}],"id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2017,7]]},"DOI":"10.1109\/tvlsi.2017.2673808","type":"journal-article","created":{"date-parts":[[2017,3,20]],"date-time":"2017-03-20T18:11:37Z","timestamp":1490033497000},"page":"2035-2044","source":"Crossref","is-referenced-by-count":7,"title":["IcoNoClast: Tackling Voltage Noise in the NoC Power Supply Through Flow-Control and Routing Algorithms"],"prefix":"10.1109","volume":"25","author":[{"given":"Prabal","family":"Basu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rajesh","family":"Jayashankara Shridevi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0228-2737","authenticated-orcid":false,"given":"Koushik","family":"Chakraborty","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sanghamitra","family":"Roy","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/6040.938290"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2006.884077"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1145\/1391469.1391584"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2009.5090627"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2008.4658640"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2009.5090651"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2007.4378783"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2013.056"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ISPASS.2013.6557149"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/NOCS.2010.18"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1147125"},{"key":"ref18","first-page":"1408","article-title":"BARP—A dynamic routing protocol for balanced distribution of traffic in NoCs","author":"lotfi-kamran","year":"2008","journal-title":"Proc DATE"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1145\/2000064.2000113"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2005.64"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2008.137"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1145\/2024724.2024930"},{"key":"ref3","article-title":"Open source NoC router RTL","author":"becker","year":"2012"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/2063384.2063454"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/NOCS.2012.31"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2014.12"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2012.272"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/2380445.2380468"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2013.215"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2012.6176488"},{"key":"ref1","year":"2017","journal-title":"ITRS 2013 Edition"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2004.825834"},{"key":"ref22","first-page":"249","article-title":"VRSync: Characterizing and eliminating synchronization-induced voltage emergencies in many-core processors","author":"miller","year":"2012","journal-title":"Proc ISCA"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2009.4798250"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/DSD.2006.9"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1147124"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2108121"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2010.104"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/ieeexplore.ieee.org\/ielaam\/92\/7956364\/7882680-aam.pdf","content-type":"application\/pdf","content-version":"am","intended-application":"syndication"},{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/92\/7956364\/07882680.pdf?arnumber=7882680","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,8]],"date-time":"2022-04-08T18:48:35Z","timestamp":1649443715000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7882680\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,7]]},"references-count":32,"journal-issue":{"issue":"7"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2017.2673808","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"value":"1063-8210","type":"print"},{"value":"1557-9999","type":"electronic"}],"subject":[],"published":{"date-parts":[[2017,7]]}}}