{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,19]],"date-time":"2026-03-19T05:22:22Z","timestamp":1773897742762,"version":"3.50.1"},"reference-count":29,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[2017,8,1]],"date-time":"2017-08-01T00:00:00Z","timestamp":1501545600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2017,8]]},"DOI":"10.1109\/tvlsi.2017.2687762","type":"journal-article","created":{"date-parts":[[2017,4,12]],"date-time":"2017-04-12T18:31:48Z","timestamp":1492021908000},"page":"2248-2257","source":"Crossref","is-referenced-by-count":31,"title":["RTN in Scaled Transistors for On-Chip Random Seed Generation"],"prefix":"10.1109","volume":"25","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-3035-0645","authenticated-orcid":false,"given":"Abinash","family":"Mohanty","sequence":"first","affiliation":[]},{"given":"Ketul B.","family":"Sutaria","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3674-4584","authenticated-orcid":false,"given":"Hiromitsu","family":"Awano","sequence":"additional","affiliation":[]},{"given":"Takashi","family":"Sato","sequence":"additional","affiliation":[]},{"given":"Yu","family":"Cao","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2004.1332710"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2004.831480"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.1998.706875"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2007.910965"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2006.1696222"},{"key":"ref15","doi-asserted-by":"crossref","first-page":"133","DOI":"10.1007\/PL00021107","article-title":"Impact of the device scaling on the low-frequency noise in n-MOSFETs","volume":"71","author":"bu","year":"2000","journal-title":"Appl Phys A Solids Surf"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ICICDT.2011.5783191"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1149\/1.3615171"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1080\/00018738900101122"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2007.910543"},{"key":"ref28","first-page":"50","article-title":"Increasing threshold voltage variation due to random telegraph noise in FETs as gate lengths scale to 20 nm","author":"tega","year":"2009","journal-title":"Proc IEEE Symp VLSI Technol"},{"key":"ref4","first-page":"27","article-title":"Real-time scalable cortical computing at 46 giga-synaptic OPS\/Watt with $\\sim 100\\times $ speedup in time-to-solution and $\\sim 100,000\\times $ reduction in energy-to-solution","author":"cassidy","year":"2014","journal-title":"Proc Int Conf High Perform Comput Netw Storage Anal"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2008.4796815"},{"key":"ref3","doi-asserted-by":"crossref","first-page":"668","DOI":"10.1126\/science.1254642","article-title":"A million spiking-neuron integrated circuit with a scalable communication network and interface","volume":"345","author":"merolla","year":"2014","journal-title":"Science"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2015.7357144"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2011.09.002"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2012.2193668"},{"key":"ref8","author":"jun","year":"1999","journal-title":"The Intel Random Number Generator"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2003.1190581"},{"key":"ref2","author":"gupta","year":"2015","journal-title":"Deep Learning with Limited Numerical Precision"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/81.847868"},{"key":"ref1","first-page":"1097","article-title":"ImageNet classification with deep convolutional neural networks","author":"krizhevsky","year":"2012","journal-title":"Proc Adv Neural Inf Process Syst"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1007\/BF00332604"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2011.5770698"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.7567\/JJAP.52.04CC24"},{"key":"ref24","year":"2001","journal-title":"A Statistical Test Suite for the Validation of Random Number Generators and Pseudo Random Number Generators for Cryptographic Applications"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2511074"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2013.6523672"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/S0038-1101(99)00324-X"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/92\/7990278\/07898409.pdf?arnumber=7898409","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,27]],"date-time":"2022-07-27T12:53:56Z","timestamp":1658926436000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7898409\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,8]]},"references-count":29,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2017.2687762","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"value":"1063-8210","type":"print"},{"value":"1557-9999","type":"electronic"}],"subject":[],"published":{"date-parts":[[2017,8]]}}}