{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T10:21:48Z","timestamp":1740133308052,"version":"3.37.3"},"reference-count":15,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[2017,9,1]],"date-time":"2017-09-01T00:00:00Z","timestamp":1504224000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"name":"POSTECH-Samsung Electronics ReRAM Cluster Research Project"},{"name":"Ministry of Science, ICT and Future Planning, South Korea, through the ICT Consilience Creative Program","award":["IITP-R0346-16-1007"],"award-info":[{"award-number":["IITP-R0346-16-1007"]}]},{"DOI":"10.13039\/501100003725","name":"Institute of Information and Communications Technology Promotion (IITP) as well as National Research Foundation of Korea","doi-asserted-by":"publisher","award":["2015R1A2A2A09001553"],"award-info":[{"award-number":["2015R1A2A2A09001553"]}],"id":[{"id":"10.13039\/501100003725","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2017,9]]},"DOI":"10.1109\/tvlsi.2017.2710140","type":"journal-article","created":{"date-parts":[[2017,6,28]],"date-time":"2017-06-28T18:10:43Z","timestamp":1498673443000},"page":"2402-2410","source":"Crossref","is-referenced-by-count":6,"title":["Investigation on the Worst Read Scenario of a ReRAM Crossbar Array"],"prefix":"10.1109","volume":"25","author":[{"given":"Yelim","family":"Youn","sequence":"first","affiliation":[]},{"given":"Kwangmin","family":"Kim","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1814-6211","authenticated-orcid":false,"given":"Jae-Yoon","family":"Sim","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8359-0063","authenticated-orcid":false,"given":"Hong-June","family":"Park","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1528-6235","authenticated-orcid":false,"given":"Byungsub","family":"Kim","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2015.2388587"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2010.2062187"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2008.2010343"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1201\/CHCOSCDAANA"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2016.2646758"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ISOCC.2015.7401656"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2013.2246791"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2016.05.007"},{"key":"ref6","first-page":"229","article-title":"Sensing and writing operations of nano-crossbar memory arrays","author":"chen","year":"2013","journal-title":"Nanoelectronic Device Applications Handbook"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.201303520"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIRC.2007.4430310"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2012.2231683"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2012.2190369"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2010.2070830"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2014.2310200"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/92\/8015212\/07961258.pdf?arnumber=7961258","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:04:29Z","timestamp":1642003469000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7961258\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,9]]},"references-count":15,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2017.2710140","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"type":"print","value":"1063-8210"},{"type":"electronic","value":"1557-9999"}],"subject":[],"published":{"date-parts":[[2017,9]]}}}