{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T10:21:49Z","timestamp":1740133309831,"version":"3.37.3"},"reference-count":40,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"11","license":[{"start":{"date-parts":[[2017,11,1]],"date-time":"2017-11-01T00:00:00Z","timestamp":1509494400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2017,11]]},"DOI":"10.1109\/tvlsi.2017.2734839","type":"journal-article","created":{"date-parts":[[2017,8,17]],"date-time":"2017-08-17T18:14:15Z","timestamp":1502993655000},"page":"3138-3151","source":"Crossref","is-referenced-by-count":14,"title":["A Low Area Overhead NBTI\/PBTI Sensor for SRAM Memories"],"prefix":"10.1109","volume":"25","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-3233-8471","authenticated-orcid":false,"given":"Maryam","family":"Karimi","sequence":"first","affiliation":[]},{"given":"Nezam","family":"Rohbani","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4347-4380","authenticated-orcid":false,"given":"Seyed-Ghassem","family":"Miremadi","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2011.2167233"},{"key":"ref38","first-page":"338","article-title":"Parameter variations and impact on circuits and microarchitecture","author":"borkar","year":"2003","journal-title":"Proc 40th Annu Des Autom Conf"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2014.6908568"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1145\/1531542.1531618"},{"journal-title":"Leakage in Nanometer CMOS Technologies","year":"2006","author":"narendra","key":"ref31"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ISLPED.2011.5993626"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/ICSICT.2010.5667399"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1117\/12.801883"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/UKSIM.2011.108"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1987.1052809"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2008.2008810"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.7567\/SSDM.2009.D-7-3"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2007.22"},{"key":"ref12","first-page":"496","article-title":"A unified online fault detection scheme via checking of stability violation","author":"yan","year":"2009","journal-title":"Proc Conf Des Autom Test Eur"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2008.4700619"},{"key":"ref14","first-page":"1478","article-title":"International technology roadmap for semiconduc-tors (ITRS)","volume":"30","author":"ravindra","year":"2001","journal-title":"J Electron Mater"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ICICDT.2014.6838608"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/IWASI.2011.6004692"},{"key":"ref17","first-page":"1","article-title":"Characterization of NBTI induced temporal performance degradation in nano-scale SRAM array using IDDQ","author":"kang","year":"2007","journal-title":"Proc IEEE Int Test Conf"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1049\/PBCS018E_ch13"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2007.896317"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.917502"},{"key":"ref4","first-page":"176","article-title":"Reliability challenges for 45nm and beyond","author":"mcpherson","year":"2006","journal-title":"Proc 43rd Annu Des Autom Conf"},{"journal-title":"Analog Circuit Techniques With Digital Interfacing","year":"2001","author":"wilmshurst","key":"ref27"},{"key":"ref3","article-title":"NBTI: A growing threat to device reliability","volume":"27","author":"peters","year":"2004","journal-title":"Semiconduct Int"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2006.10.012"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4614-8881-1"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/978-94-007-7663-0"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/1837274.1837486"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2011.2136316"},{"key":"ref2","first-page":"1322","article-title":"Emerging yield and reliability challenges in nanometer CMOS technologies","author":"gielen","year":"2008","journal-title":"Proc Conf Des Autom Test Eur"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2007.375188"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2004.1311888"},{"key":"ref20","first-page":"730","article-title":"Estimation of statistical variation in temporal NBTI degradation and its impact on lifetime circuit performance","author":"kang","year":"2007","journal-title":"Proc IEEE\/ACMInt Conf Comput -Aided Des"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2006.73"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2007.369932"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2014.2355873"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2008.4558900"},{"journal-title":"CMOS VLSI Design A Circuits and Systems Perspective","year":"2006","author":"weste","key":"ref26"},{"journal-title":"Semiconductor memory","year":"1973","author":"luecke","key":"ref25"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/92\/8079089\/08012396.pdf?arnumber=8012396","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:22:20Z","timestamp":1642004540000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8012396\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,11]]},"references-count":40,"journal-issue":{"issue":"11"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2017.2734839","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"type":"print","value":"1063-8210"},{"type":"electronic","value":"1557-9999"}],"subject":[],"published":{"date-parts":[[2017,11]]}}}