{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T10:21:52Z","timestamp":1740133312058,"version":"3.37.3"},"reference-count":26,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2018,2,1]],"date-time":"2018-02-01T00:00:00Z","timestamp":1517443200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2018,2]]},"DOI":"10.1109\/tvlsi.2017.2762006","type":"journal-article","created":{"date-parts":[[2017,11,8]],"date-time":"2017-11-08T19:21:09Z","timestamp":1510168869000},"page":"308-318","source":"Crossref","is-referenced-by-count":2,"title":["Automatic Correction of Dynamic Power Management Architecture in Modern Processors"],"prefix":"10.1109","volume":"26","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-6725-7001","authenticated-orcid":false,"given":"Reza","family":"Sharafinejad","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4436-4597","authenticated-orcid":false,"given":"Bijan","family":"Alizadeh","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zainalabedin","family":"Navabi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/FPT.2010.5681434"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/FPT.2013.6718329"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/2348839.2348841"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1587\/transinf.E97.D.852"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.micpro.2013.10.002"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2014.2329687"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-26287-1_16"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI-SoC.2015.7314426"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2017.2675380"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-58179-0_44"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/s10703-009-0077-x"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cds.2011.0352"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2015.7116288"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2014.6783382"},{"journal-title":"JasperGold Low-Power Verification App","year":"2015","key":"ref8"},{"key":"ref7","first-page":"717","article-title":"Reviving erroneous stability-based clock-gating using partial max-SAT","author":"le","year":"2013","journal-title":"Proc IEEE Asian-South Pacific Design Autom Conf"},{"year":"2016","key":"ref2"},{"journal-title":"Synopsys Low Power Verification Tools Suite User Guide","year":"2014","key":"ref9"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2013.2267454"},{"journal-title":"UCLID Ver 3 1","year":"2013","key":"ref20"},{"journal-title":"Mips32 Architecture","year":"2010","key":"ref22"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.852031"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.micpro.2012.06.004"},{"journal-title":"GRLIB IP CORE User&#x2019;s Manual Version 1 0 17&#x2013;B2710","year":"2007","key":"ref23"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-31612-8_10"},{"key":"ref25","first-page":"502","article-title":"An extensible SAT-solver","author":"e\u00e9n","year":"2003","journal-title":"Proc Int Conf Theory Appl Satisfiability Test"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/92\/8263418\/08101312.pdf?arnumber=8101312","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:27:24Z","timestamp":1642004844000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8101312\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,2]]},"references-count":26,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2017.2762006","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"type":"print","value":"1063-8210"},{"type":"electronic","value":"1557-9999"}],"subject":[],"published":{"date-parts":[[2018,2]]}}}