{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T10:21:56Z","timestamp":1740133316460,"version":"3.37.3"},"reference-count":68,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2018,12,1]],"date-time":"2018-12-01T00:00:00Z","timestamp":1543622400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2018,12,1]],"date-time":"2018-12-01T00:00:00Z","timestamp":1543622400000},"content-version":"am","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2018,12,1]],"date-time":"2018-12-01T00:00:00Z","timestamp":1543622400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2018,12,1]],"date-time":"2018-12-01T00:00:00Z","timestamp":1543622400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000001","name":"National Science Foundation","doi-asserted-by":"publisher","award":["CCF-1755874"],"award-info":[{"award-number":["CCF-1755874"]}],"id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]},{"name":"The University of Utah Seed"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2018,12]]},"DOI":"10.1109\/tvlsi.2018.2808468","type":"journal-article","created":{"date-parts":[[2018,3,14]],"date-time":"2018-03-14T18:18:41Z","timestamp":1521051521000},"page":"2709-2722","source":"Crossref","is-referenced-by-count":7,"title":["Accelerating <inline-formula> \n                     <tex-math notation=\"LaTeX\">$k$ <\/tex-math>\n                  <\/inline-formula>-Medians Clustering Using a Novel 4T-4R RRAM Cell"],"prefix":"10.1109","volume":"26","author":[{"given":"Yomi Karthik","family":"Rupesh","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Payman","family":"Behnam","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Goverdhan Reddy","family":"Pandla","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Manikanth","family":"Miryala","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1496-5650","authenticated-orcid":false,"given":"Mahdi","family":"Nazm Bojnordi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/ISCA.1998.694774"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/54.748803"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2010.2070830"},{"journal-title":"Resistive Memory Devices for Radiation Resistant Non-Volatile Memory","year":"2017","key":"ref32"},{"key":"ref31","first-page":"1","article-title":"Investigation of radiation hardness of HfO2 resistive random access memory","author":"tsui","year":"2014","journal-title":"Proc IEEE Int Sym VLSI Tech Syst and Appl (VLSI-TSA)"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2009.5236059"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/2.375174"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2014.2385431"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2008.160"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2013.2277715"},{"key":"ref60","doi-asserted-by":"publisher","DOI":"10.1145\/3123939.3124545"},{"key":"ref62","doi-asserted-by":"crossref","first-page":"585","DOI":"10.1109\/ISQED.2006.91","article-title":"New generation of predictive technology model for sub-45 nm design exploration","author":"zhao","year":"2006","journal-title":"Proc Int Symp Quality Electronic Design (ISQED)"},{"key":"ref61","doi-asserted-by":"publisher","DOI":"10.1145\/1143844.1143892"},{"key":"ref63","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2012.2185930"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/S0146-664X(81)80010-X"},{"key":"ref64","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2012.2215714"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2009.5236042"},{"journal-title":"Free PDK 45 nm Open-Access Based PDK for the 45 nm Technology Node","year":"2017","key":"ref65"},{"key":"ref66","first-page":"365","article-title":"Dark silicon and the end of multicore scaling","author":"esmaeilzadeh","year":"2011","journal-title":"2011 38th Annual International Symposium on Computer Architecture (ISCA) ISCA"},{"key":"ref29","first-page":"15","article-title":"Two-dimensional rank order filter","author":"szedo","year":"2006"},{"key":"ref67","doi-asserted-by":"publisher","DOI":"10.1109\/MCAS.2009.935695"},{"key":"ref68","first-page":"166t","article-title":"Self-rectifying bipolar TaOx\/TiO2 RRAM with superior endurance over \n$10^{12}$\n cycles for 3D high-density storage-class memory","author":"hsu","year":"2013","journal-title":"Proc Symp VLSI Technol"},{"key":"ref2","first-page":"1","article-title":"Spark: cluster computing with working sets","volume":"10","author":"zaharia","year":"2010","journal-title":"HotCloud"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1002\/pmic.201500396"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.1999.777904"},{"journal-title":"Algorithms for clustering data","year":"1988","author":"jain","key":"ref22"},{"journal-title":"The hardness of k-means clustering in the plane","year":"2009","author":"vattani","key":"ref21"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1145\/278459.258601"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/S0306-4379(02)00072-8"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-63460-6_154"},{"key":"ref25","first-page":"88","article-title":"Hardware implementation design of analog neural rank-order filter","author":"tymoshchuk","year":"2015","journal-title":"Proc 11th Int Conf Perspective Technol Methods MEMS Design (MEMSTECH)"},{"journal-title":"Data Conversion Handbook","year":"2005","author":"kester","key":"ref50"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2016.7446049"},{"key":"ref59","doi-asserted-by":"publisher","DOI":"10.1145\/1669112.1669172"},{"article-title":"CACTI 6.0: A tool to model large caches","year":"2009","author":"muralimanohar","key":"ref58"},{"journal-title":"UCI Machine Learning Repository","year":"2013","author":"lichman","key":"ref57"},{"key":"ref56","doi-asserted-by":"publisher","DOI":"10.1109\/IPIN.2014.7275492"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1038\/nature18003"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2013.6522340"},{"journal-title":"AMD64 Architecture Programmer's Manual Volume 2 System Programming","year":"2010","key":"ref53"},{"journal-title":"IA-32 Intel Architecture Optimization Reference Manual","year":"2003","key":"ref52"},{"key":"ref10","first-page":"1","article-title":"Unsupervised surgical task segmentation with milestone learning","author":"krishnan","year":"2015","journal-title":"Proc Int Symp Robot Res (ISRR)"},{"journal-title":"Clustering by Means of Medoids","year":"1987","author":"kaufman","key":"ref11"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2012.6378608"},{"key":"ref12","first-page":"147","article-title":"Using the triangle inequality to accelerate k-means","author":"elkan","year":"2003","journal-title":"Proc 20th Int Conf Mach Learn (ICML)"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1145\/1772690.1772862"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/1873951.1874249"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.14778\/1687627.1687730"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TASSP.1986.1164871"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1145\/2312005.2312045"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/INTENSIVE.2009.19"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1145\/2775054.2694358"},{"journal-title":"An empirical evaluation of deep learning on highway driving","year":"2015","author":"huval","key":"ref4"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1126\/science.aaa8415"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.3846\/20294913.2016.1185047"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2014.06.002"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-30367-3_2"},{"key":"ref7","first-page":"281","article-title":"Some methods for classification and analysis of multivariate observations","volume":"1","author":"macqueen","year":"1967","journal-title":"Proc 5th Berkeley Symp Math Statist Probab"},{"journal-title":"VLSI Design Techniques for Analog and Digital Circuits","year":"1990","author":"geiger","key":"ref49"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1002\/jmri.24663"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2010.5556180"},{"journal-title":"The 2013 Edition of the International Technology Roadmap for Semiconductors","year":"2017","key":"ref45"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1049\/el:19920226"},{"journal-title":"Principles of Data Conversion System Design","year":"1995","author":"razavi","key":"ref47"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/AHS.2011.5963944"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/40.592312"},{"journal-title":"8Gb DDR3 SDRAM","year":"2009","key":"ref44"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/SBCCI.2003.1232813"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"https:\/\/ieeexplore.ieee.org\/ielaam\/92\/8554317\/8315514-aam.pdf","content-type":"application\/pdf","content-version":"am","intended-application":"syndication"},{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/92\/8554317\/08315514.pdf?arnumber=8315514","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,8]],"date-time":"2022-04-08T18:48:31Z","timestamp":1649443711000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8315514\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,12]]},"references-count":68,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2018.2808468","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"type":"print","value":"1063-8210"},{"type":"electronic","value":"1557-9999"}],"subject":[],"published":{"date-parts":[[2018,12]]}}}