{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,31]],"date-time":"2026-03-31T14:22:39Z","timestamp":1774966959862,"version":"3.50.1"},"reference-count":29,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"10","license":[{"start":{"date-parts":[[2018,10,1]],"date-time":"2018-10-01T00:00:00Z","timestamp":1538352000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2018,10,1]],"date-time":"2018-10-01T00:00:00Z","timestamp":1538352000000},"content-version":"am","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2018,10,1]],"date-time":"2018-10-01T00:00:00Z","timestamp":1538352000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2018,10,1]],"date-time":"2018-10-01T00:00:00Z","timestamp":1538352000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"NSF CAREER Award","award":["EECS-1727447"],"award-info":[{"award-number":["EECS-1727447"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2018,10]]},"DOI":"10.1109\/tvlsi.2018.2834373","type":"journal-article","created":{"date-parts":[[2018,5,22]],"date-time":"2018-05-22T19:04:45Z","timestamp":1527015885000},"page":"2099-2107","source":"Crossref","is-referenced-by-count":14,"title":["From Design to Test: A High-Speed PRBS"],"prefix":"10.1109","volume":"26","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-6604-942X","authenticated-orcid":false,"given":"Kehan","family":"Zhu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vishal","family":"Saxena","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.856578"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2006.878112"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/WMED.2015.7093690"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2017.8050878"},{"key":"ref14","author":"power","year":"1978","journal-title":"Introduction to Dynamics and Control"},{"key":"ref15","article-title":"On-chip self-test circuit blocks for high-speed applications","author":"laskin","year":"2006"},{"key":"ref16","first-page":"62","article-title":"A 40\/50\/100 Gb\/s PAM-4 Ethernet transceiver in 28 nm CMOS","author":"gopalakrishnan","year":"2016","journal-title":"IEEE ISSCC Dig Tech Papers"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2016.7417909"},{"key":"ref18","first-page":"128","article-title":"A 20 Gb\/s NRZ\/PAM-4 1 V transmitter in 40 nm CMOS driving a Si-photonic modulator in 0.13 \n$\\mu\\text{m}$\n CMOS","author":"wu","year":"2013","journal-title":"IEEE ISSCC Dig Tech Papers"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2014.2387682"},{"key":"ref28","year":"2008","journal-title":"TDR impedance measurements A foundation for signal integrity"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/PROC.1980.11697"},{"key":"ref27","author":"kundert","year":"2003","journal-title":"The Designers Guide to SPICE and SPECTRE"},{"key":"ref3","author":"metzger","year":"1972","journal-title":"An ordered table of primitive polynomials over GF(2) of degrees 2 through 19 for use with linear maximal sequence generators"},{"key":"ref6","year":"2016","journal-title":"PRBS31Q Example Sequence"},{"key":"ref29","article-title":"PLL design using the PLL design assistant program","volume":"33","author":"perrott","year":"2005"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICTON.2017.8024973"},{"key":"ref8","year":"2014","journal-title":"MP1800 A Signal Quality Analyzer Operation Manual"},{"key":"ref7","year":"2017","journal-title":"Improved SSPRQ Pattern for Testing Optical Transmitters"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1049\/ree.1975.0033"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.854597"},{"key":"ref1","year":"2017","journal-title":"IEEE P802 3bs 200 Gb\/s and 400 Gb\/s Ethernet Task Force"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2015.7282203"},{"key":"ref22","author":"gray","year":"2008","journal-title":"Analysis and Design of Analog Integrated Circuits"},{"key":"ref21","article-title":"Integrated circuit design for hybrid optoelectronic interconnects","author":"zhu","year":"2016"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/4.32036"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.843612"},{"key":"ref26","year":"2014","journal-title":"SG-MLF-7008 Datasheet"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1007\/978-0-387-28341-8"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"https:\/\/ieeexplore.ieee.org\/ielaam\/92\/8472222\/8362707-aam.pdf","content-type":"application\/pdf","content-version":"am","intended-application":"syndication"},{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/92\/8472222\/08362707.pdf?arnumber=8362707","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,8]],"date-time":"2022-04-08T18:48:33Z","timestamp":1649443713000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8362707\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,10]]},"references-count":29,"journal-issue":{"issue":"10"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2018.2834373","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"value":"1063-8210","type":"print"},{"value":"1557-9999","type":"electronic"}],"subject":[],"published":{"date-parts":[[2018,10]]}}}