{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,27]],"date-time":"2025-09-27T22:08:13Z","timestamp":1759010893158,"version":"3.37.3"},"reference-count":48,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"7","license":[{"start":{"date-parts":[[2019,7,1]],"date-time":"2019-07-01T00:00:00Z","timestamp":1561939200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,7,1]],"date-time":"2019-07-01T00:00:00Z","timestamp":1561939200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,7,1]],"date-time":"2019-07-01T00:00:00Z","timestamp":1561939200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001659","name":"Deutsche Forschungsgemeinschaft","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001659","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2019,7]]},"DOI":"10.1109\/tvlsi.2019.2899890","type":"journal-article","created":{"date-parts":[[2019,3,12]],"date-time":"2019-03-12T22:39:55Z","timestamp":1552430395000},"page":"1652-1665","source":"Crossref","is-referenced-by-count":13,"title":["Modeling the Interdependences Between Voltage Fluctuation and BTI Aging"],"prefix":"10.1109","volume":"27","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-1044-7231","authenticated-orcid":false,"given":"Sami","family":"Salamin","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6629-4713","authenticated-orcid":false,"given":"Victor M.","family":"Van Santen","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5649-3102","authenticated-orcid":false,"given":"Hussam","family":"Amrouch","sequence":"additional","affiliation":[]},{"given":"Narendra","family":"Parihar","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4516-766X","authenticated-orcid":false,"given":"Souvik","family":"Mahapatra","sequence":"additional","affiliation":[]},{"given":"Jorg","family":"Henkel","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref39","first-page":"298","article-title":"Comparison of split-versus connected-core supplies in the POWER6 microprocessor","author":"james","year":"2007","journal-title":"IEEE ISSCC Dig Tech Papers"},{"doi-asserted-by":"publisher","key":"ref38","DOI":"10.1109\/DATE.2011.5763296"},{"doi-asserted-by":"publisher","key":"ref33","DOI":"10.1109\/IRPS.2018.8353699"},{"key":"ref32","first-page":"4a.3.1","article-title":"Combined trap generation and transient trap occupancy model for time evolution of NBTI during DC multi-cycle and AC stress","author":"goel","year":"2015","journal-title":"Proc IEEE Int Rel Phys Symp (IRPS)"},{"key":"ref31","first-page":"448","article-title":"Analysis of NBTI degradation- and recovery-behavior based on ultra fast VT-measurements","author":"reisinger","year":"2006","journal-title":"Proc IEEE Intl Rel Phys Symp"},{"doi-asserted-by":"publisher","key":"ref30","DOI":"10.1109\/TDMR.2007.911385"},{"doi-asserted-by":"publisher","key":"ref37","DOI":"10.1109\/ASPDAC.2008.4483978"},{"doi-asserted-by":"publisher","key":"ref36","DOI":"10.1109\/IEDM.2017.8268345"},{"doi-asserted-by":"publisher","key":"ref35","DOI":"10.1109\/TED.2017.2773122"},{"doi-asserted-by":"publisher","key":"ref34","DOI":"10.1109\/IRPS.2018.8353700"},{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1109\/ICCAD.2010.5654309"},{"doi-asserted-by":"publisher","key":"ref40","DOI":"10.1109\/TCSII.2007.901574"},{"year":"2019","journal-title":"Aging-IR-Aware Cell Libraries","key":"ref11"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1145\/2897937.2898082"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1109\/VTS.2017.7928936"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1109\/IRPS.2015.7112757"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1109\/TVLSI.2016.2643618"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.3850\/9783981537079_0751"},{"doi-asserted-by":"publisher","key":"ref17","DOI":"10.1016\/j.microrel.2015.06.008"},{"key":"ref18","article-title":"Non uniform on chip power delivery network synthesis methodology","volume":"abs 1711 425","author":"benediktsson","year":"2017","journal-title":"Comput Res Repository"},{"year":"2009","author":"wang","journal-title":"Electronic Design Automation Synthesis Verification and Test","key":"ref19"},{"key":"ref28","first-page":"1","article-title":"Aging-aware timing analysis and optimization considering path sensitization","author":"wu","year":"2011","journal-title":"Proceedings of the Design Automation and Test in Europe (DATE)"},{"year":"2010","author":"hu","journal-title":"Modern Semiconductor Devices for Integrated Circuits","key":"ref4"},{"doi-asserted-by":"publisher","key":"ref27","DOI":"10.1109\/IRPS.2015.7112757"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/TED.2018.2869669"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/IRPS.2018.8353651"},{"doi-asserted-by":"publisher","key":"ref29","DOI":"10.1016\/j.microrel.2013.12.017"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1109\/ASPDAC.2013.6509663"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/TED.2017.2780083"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/TCSI.2017.2717790"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/IRPS.2017.7936352"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1109\/IRPS.2013.6531957"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/TED.2013.2238237"},{"year":"2018","journal-title":"Nangate 45 PDK is a 45 nm Open Source Digital Cell Library Based on PTM","key":"ref46"},{"year":"2018","journal-title":"Static-and-Dynamic-Power-IR-Analysis Cadence Official Forum","key":"ref20"},{"key":"ref45","article-title":"PULPino: A small single-core RISC-V SoC","author":"traber","year":"2016","journal-title":"Proc 3rd RISCV Workshop"},{"key":"ref48","doi-asserted-by":"crossref","first-page":"585","DOI":"10.1109\/ISQED.2006.91","article-title":"New Generation of Predictive Technology Model for Sub-45nm Design Exploration","author":"zhao","year":"2006","journal-title":"Proc Int Symp Quality Electronic Design (ISQED)"},{"key":"ref22","first-page":"198","article-title":"A novel framework for faster-than-at-speed delay test considering IR-drop effects","author":"ahmed","year":"2006","journal-title":"Proc IEEE\/ACM Int Conf Comput Aided Design"},{"year":"2018","journal-title":"BSIM Compact MOSFET Models for SPICE Simulation","key":"ref47"},{"doi-asserted-by":"publisher","key":"ref21","DOI":"10.1109\/ISQED.2010.5450515"},{"year":"2018","journal-title":"Innovus Implementation System","key":"ref42"},{"year":"2005","author":"elgamel","journal-title":"Interconnect Noise Optimization in Nanometer Technologies","key":"ref24"},{"year":"2018","journal-title":"Design Compiler RTL Synthesis","key":"ref41"},{"doi-asserted-by":"publisher","key":"ref23","DOI":"10.5194\/ars-4-197-2006"},{"year":"2018","journal-title":"Tempus Timing Signoff Solution","key":"ref44"},{"doi-asserted-by":"publisher","key":"ref26","DOI":"10.1109\/IRPS.2017.7936335"},{"year":"2018","journal-title":"Voltus IC Power Integrity Solution","key":"ref43"},{"doi-asserted-by":"publisher","key":"ref25","DOI":"10.1109\/IRPS.2018.8353648"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/92\/8746725\/08665917.pdf?arnumber=8665917","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,13]],"date-time":"2022-07-13T20:53:56Z","timestamp":1657745636000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8665917\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,7]]},"references-count":48,"journal-issue":{"issue":"7"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2019.2899890","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"type":"print","value":"1063-8210"},{"type":"electronic","value":"1557-9999"}],"subject":[],"published":{"date-parts":[[2019,7]]}}}