{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,20]],"date-time":"2026-01-20T10:49:31Z","timestamp":1768906171886,"version":"3.49.0"},"reference-count":37,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2019,12,1]],"date-time":"2019-12-01T00:00:00Z","timestamp":1575158400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,12,1]],"date-time":"2019-12-01T00:00:00Z","timestamp":1575158400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,12,1]],"date-time":"2019-12-01T00:00:00Z","timestamp":1575158400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Technology Foundation STW through the Dutch Government","award":["13499 TYPHOON\u2014VIDI"],"award-info":[{"award-number":["13499 TYPHOON\u2014VIDI"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2019,12]]},"DOI":"10.1109\/tvlsi.2019.2937365","type":"journal-article","created":{"date-parts":[[2019,9,13]],"date-time":"2019-09-13T20:34:46Z","timestamp":1568406886000},"page":"2802-2815","source":"Crossref","is-referenced-by-count":32,"title":["A Systematic Evaluation of Profiling Through Focused Feature Selection"],"prefix":"10.1109","volume":"27","author":[{"given":"Stjepan","family":"Picek","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1095-5420","authenticated-orcid":false,"given":"Annelie","family":"Heuser","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3821-8091","authenticated-orcid":false,"given":"Alan","family":"Jovic","sequence":"additional","affiliation":[]},{"given":"Lejla","family":"Batina","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1023\/A:1012487302797"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1145\/1015330.1015435"},{"key":"ref31","doi-asserted-by":"crossref","first-page":"267","DOI":"10.1111\/j.2517-6161.1996.tb02080.x","article-title":"Regression shrinkage and selection via the lasso","volume":"58","author":"tibshirani","year":"1994","journal-title":"J Roy Stat Soc B"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/S0004-3702(97)00043-X"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2018.2875746"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1162\/neco.1996.8.7.1341"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1137\/090771806"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1111\/j.1467-9868.2010.00740.x"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/s13389-014-0089-3"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/s13389-017-0172-7"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-21966-0_15"},{"key":"ref13","first-page":"13","article-title":"Test vector leakage assessment (TVLA) methodology in practice","author":"becker","year":"2013","journal-title":"Proc Int Cryptographic Module Conf"},{"key":"ref14","first-page":"13","article-title":"Template attacks","volume":"2523","author":"chari","year":"2002","journal-title":"Cryptographic Hardware and Embedded Systems—CHES"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-21476-4_2"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-33027-8_10"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/IJCNN.2017.7966373"},{"key":"ref18","first-page":"1","article-title":"Principal and independent component analysis for crypto-systems with hardware unmasked units","author":"bohy","year":"2003","journal-title":"Proc E-Smart"},{"key":"ref19","year":"2014","journal-title":"DPA Contest ( $4^ th $ Edition)"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4614-7138-7"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/11894063_2"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ICCCC.2016.7496749"},{"key":"ref3","doi-asserted-by":"crossref","first-page":"3","DOI":"10.1007\/978-3-319-49445-6_1","article-title":"Breaking cryptographic implementations using deep learning techniques","volume":"10076","author":"maghrebi","year":"2016","journal-title":"Security Privacy and Applied Cryptography Engineering"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-05072-6_10"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/B978-1-55860-335-6.50023-4"},{"key":"ref5","author":"mangard","year":"2006","journal-title":"Power Analysis Attacks Revealing the Secrets of Smart Cards"},{"key":"ref8","doi-asserted-by":"crossref","first-page":"148","DOI":"10.46586\/tches.v2019.i3.148-179","article-title":"Make some noise. Unleashing the power of convolutional neural networks for profiled side-channel analysis","volume":"2019","author":"kim","year":"2019","journal-title":"IACR Transactions on Cryptographic Hardware and Embedded Systems"},{"key":"ref7","first-page":"209","article-title":"The curse of class imbalance and conflicting metrics with machine learning for side-channel evaluations","volume":"2019","author":"picek","year":"2019","journal-title":"IACR Transactions on Cryptographic Hardware and Embedded Systems"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1504\/IJACT.2014.062722"},{"key":"ref9","first-page":"45","article-title":"Convolutional neural networks with data augmentation against jitter-based countermeasures—Profiling attacks without pre-processing","volume":"10529","author":"cagli","year":"2017","journal-title":"Proc 8th Int Conf Cryptogr Hardw Embedded Syst (CHES)"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-29912-4_18"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-04138-9_12"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-08302-5_17"},{"key":"ref21","first-page":"3133","article-title":"Do we need hundreds of classifiers to solve real world classification problems?","volume":"15","author":"fern\u00e1andez-delgado","year":"2014","journal-title":"J Mach Learn Res"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4757-2440-0"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1023\/A:1010933404324"},{"key":"ref26","first-page":"1200","article-title":"A review of feature selection methods with applications","author":"jovi?","year":"2015","journal-title":"Proc 38th Int Conv Inf Commun Technol Electron Microelectron (MIPRO)"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-01001-9_26"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/92\/8910476\/08836108.pdf?arnumber=8836108","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,7,23]],"date-time":"2024-07-23T11:57:04Z","timestamp":1721735824000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8836108\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,12]]},"references-count":37,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2019.2937365","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"value":"1063-8210","type":"print"},{"value":"1557-9999","type":"electronic"}],"subject":[],"published":{"date-parts":[[2019,12]]}}}