{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,27]],"date-time":"2026-06-27T16:24:29Z","timestamp":1782577469560,"version":"3.54.5"},"reference-count":20,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2021,2,1]],"date-time":"2021-02-01T00:00:00Z","timestamp":1612137600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,2,1]],"date-time":"2021-02-01T00:00:00Z","timestamp":1612137600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,2,1]],"date-time":"2021-02-01T00:00:00Z","timestamp":1612137600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. VLSI Syst."],"published-print":{"date-parts":[[2021,2]]},"DOI":"10.1109\/tvlsi.2020.3038368","type":"journal-article","created":{"date-parts":[[2020,12,1]],"date-time":"2020-12-01T22:44:26Z","timestamp":1606862666000},"page":"423-433","source":"Crossref","is-referenced-by-count":2,"title":["Single Test Type to Replace Broadside and Skewed-Load Tests for Transition Faults"],"prefix":"10.1109","volume":"29","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-5491-7282","authenticated-orcid":false,"given":"Irith","family":"Pomeranz","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1794-3788","authenticated-orcid":false,"given":"Xijiang","family":"Lin","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2011.5783735"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2016.7805866"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2018.2873233"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2003.819424"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2008.4700648"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2019.8758644"},{"key":"ref16","doi-asserted-by":"crossref","first-page":"1128","DOI":"10.1109\/43.406714","article-title":"Test application time reduction for sequential circuits with scan","volume":"14","author":"lee","year":"1995","journal-title":"IEEE Trans Comput -Aided Design Integr Circuits Syst"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1145\/775832.776000"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2007.4437648"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2018.8624752"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cdt:20060142"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2006.884405"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1992.279311"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2011.5783760"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2005.6"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894283"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/43.298042"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/43.238615"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2005.36"},{"key":"ref20","author":"bardell","year":"1987","journal-title":"Built-In Test for VLSI Pseudorandom Techniques"}],"container-title":["IEEE Transactions on Very Large Scale Integration (VLSI) Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/92\/9336749\/09275338.pdf?arnumber=9275338","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T14:50:32Z","timestamp":1652194232000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9275338\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,2]]},"references-count":20,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tvlsi.2020.3038368","relation":{},"ISSN":["1063-8210","1557-9999"],"issn-type":[{"value":"1063-8210","type":"print"},{"value":"1557-9999","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021,2]]}}}